Method for sorting integrated circuit devices
First Claim
Patent Images
1. A test method in an integrated circuit (IC) manufacturing process for determining IC devices in need of enhanced reliability testing from a group of IC devices undergoing test procedures, the IC devices each having a substantially unique identification (ID) code, the method comprising:
- storing an enhanced reliability testing flag in connection with the ID code of each IC device of the IC devices in the group indicating whether each IC device is in need of enhanced reliability testing;
automatically reading the ID code of each IC device of the IC devices in the group;
accessing the enhanced reliability testing flag stored in connection with each of the automatically read ID codes of each IC device having the ID code thereof read; and
sorting the IC devices in accordance with whether their enhanced reliability testing flag indicates they are in need of enhanced reliability testing.
0 Assignments
0 Petitions
Accused Products
Abstract
A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, includes automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes.
0 Citations
2 Claims
-
1. A test method in an integrated circuit (IC) manufacturing process for determining IC devices in need of enhanced reliability testing from a group of IC devices undergoing test procedures, the IC devices each having a substantially unique identification (ID) code, the method comprising:
-
storing an enhanced reliability testing flag in connection with the ID code of each IC device of the IC devices in the group indicating whether each IC device is in need of enhanced reliability testing;
automatically reading the ID code of each IC device of the IC devices in the group;
accessing the enhanced reliability testing flag stored in connection with each of the automatically read ID codes of each IC device having the ID code thereof read; and
sorting the IC devices in accordance with whether their enhanced reliability testing flag indicates they are in need of enhanced reliability testing.
-
-
2. A test method in an integrated circuit (IC) manufacturing process for separating IC devices manufactured on one or more semiconductor wafers to determine the need of enhanced reliability testing from a group of IC devices undergoing test procedures, the IC devices each having a substantially unique identification (ID) code, the method comprising:
-
storing an enhanced reliability testing flag in connection with the ID code of each IC device of the IC devices in the group indicating whether each IC device is needing enhanced reliability testing;
automatically reading the ID code of each IC device of the IC devices in the group;
accessing the enhanced reliability testing flag stored in connection with each of the automatically read ID codes of each IC device having the ID code thereof read; and
sorting the IC devices in accordance with whether their enhanced reliability testing flag indicates the IC device comes from a semiconductor wafer which is known as an unreliable semiconductor wafer.
-
Specification