Test element analysis system

• US 20020037238A1
• Filed: 06/29/2001
• Published: 03/28/2002
• Est. Priority Date: 07/01/2000
• Status: Active Grant

• Current Assignee: Roche Diabetes Care Inc. (Roche Holding AG)
• Original Assignee: Roche Diagnostics Operations Incorporated (Roche Holding AG)
• Inventors: Meacham, George B.K., Haar, Hans-Peter
• Granted Patent: US 6,787,109 B2
• Time in Patent Office: Days
• US Class Current: 422/68.1
• CPC Class Codes: G01N 27/3273 Devices therefor, e.g. test element readers, circuitry details not specific to biochemical electrodes G01N33/4875
• CPC Class Codes: G01N 27/3274 Corrective measures, e.g. error detection, compensation for temperature or hematocrit, calibration coding of calibration information G01N33/48771

Abstract

Analysis system for the analytical investigation of a sample, in particular of a body fluid. It consists of test elements brought into contact, for performing an analysis, with a sample to be investigated, and an evaluation apparatus with a test element support for positioning the test element in a measurement position, as well as a measurement and evaluation electronic device. The measurement and evaluation electronic device of the evaluation apparatus comprises a temperature correction device, in order to take into account the temperature prevailing in the measurement zone during the measurement for the determination of the result of the analysis. The temperature correction unit includes a temperature history imaging device for the currentless tracing of the temperature history before the time of measuring, without consuming electric energy before the time of measuring.

Claims

1. Analysis system for the analytical investigation of a sample, in particular of a body fluid, of human or animals, comprising

test elements which, for performing an analysis, are brought into contact with a sample to be investigated, thereafter a measurable change characteristic for the analysis occuring in a measuring zone of the test element, and

an evaluation apparatus with a test element support for positioning the test element in a measuring position, and a measurement and evaluation electronic device for measuring the characteristic change and for determining based on the result of the measurement a result of the analysis,

wherein

the measurement and evaluation electronic device comprises a temperature correction unit for taking into account in the determination of the result of the analysis the temperature prevailing in the measurement zone at the time of measurement, based on a temperature measurement performed by a temperature sensor located in a position remote from the measurement zone, and

the temperature correction unit includes a temperature history imaging device for the currentless tracing of the temperature history before the moment of measuring, without consumption of electric energy before the time of measurement.

2. Analysis system according to claim 1, wherein the temperature history imaging device includes a thermal mass suspended thermally insulated from the structure of the apparatus and a plurality of temperature sensors located at different positions, at least one of the temperature sensors being a temperature history control sensor located in the interior of the thermal mass.

3. Analysis system according to claim 2, wherein a second temperature sensor is located, as reference sensor of the temperature history imaging device, in the vicinity of the thermal mass, but without contact to it.

4. Analysis system according to claim 2, wherein the thermal conductivity of the thermal mass is so low that changes of the ambient temperature lead to measurable temperature gradients in the interior of the thermal mass such that the gradients form an image of the change of the ambient temperature for a period of at least five minutes, and that at least two temperature sensors of the temperature history imaging device are located in contact with the thermal mass.

5. Analysis system according to claim 4, wherein one of the temperature sensors is located at the surface of the thermal mass.

6. Analysis system according to claim 4, wherein the location of the temperature history control sensor in the thermal mass is such that the distance between the sensor and all points of the boundary surface of the thermal mass which are not thermally insulated from the ambient air is essentially the same.

7. Analysis system according to claim 6, wherein the thermal mass is spherical, its surface is not thermally insulated from the ambient air, and the temperature history control sensor is located in the center of the thermal mass.

8. Analysis system according to claim 6, wherein the thermal mass is disk-shaped, the flat sides of the disk are thermally insulated from the ambient air, and the temperature history control sensor is located in the center of the disk.