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Semiconductor test apparatus

  • US 20020043987A1
  • Filed: 07/23/2001
  • Published: 04/18/2002
  • Est. Priority Date: 07/26/2000
  • Status: Active Grant
First Claim
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1. A semiconductor test apparatus that applies a variable voltage to a measured device to test the measured device, providing:

  • constant voltage generating devices that generate a plurality of variable voltages;

    voltage polarity control devices that control the polarity of the plurality of variable voltages generated by said constant voltage generating device;

    control elements that generate an applied variable voltage applied to said measured device from the plurality of variable voltages whose parity is controlled by said voltage polarity control devices;

    a first control device that controls the generation operation of the applied variable voltage in said control elements based on the fixed applied voltage that is applied to said measured device and the terminal voltage of said measured device fed back from said measured device; and

    a second control device that controls the variable voltage value controlled by said constant voltage generating device and the polarity control controlled by said voltage polarity control device based on the fixed applied voltage that is applied to said measured device and the terminal voltage of said measured device fed back from said measured device.

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