Substrate provided with antireflection films and its production method
First Claim
1. A substrate provided with antireflection films, which comprises a transparent substrate and at least two antireflection film layers deposited on one side of the transparent substrate, wherein the reflectance on the film face of light incident at an angle of incidence of 50 from the film face side is at most 6% at the entire wavelength region ranging from 400 to 480 nm.
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Accused Products
Abstract
It is to provide a substrate provided with antireflection films, which is excellent in antireflection properties to incident light at an oblique angle from the film face side, which has a high transmittance and with which the reflection color tone does not tend to be bluish.
A substrate provided with antireflection films, which comprises a transparent substrate and at least two antireflection film layers deposited on one side of the transparent substrate,
wherein the reflectance on the film face of light incident at an angle of incidence of 5° from the film face side is at most 6% at the entire wavelength region ranging from 400 to 480 nm.
24 Citations
17 Claims
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1. A substrate provided with antireflection films, which comprises a transparent substrate and at least two antireflection film layers deposited on one side of the transparent substrate,
wherein the reflectance on the film face of light incident at an angle of incidence of 50 from the film face side is at most 6% at the entire wavelength region ranging from 400 to 480 nm.
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2. A substrate provided with antireflection films, which comprises a transparent substrate and first and second antireflection film layers deposited in this order on one side of the transparent substrate,
wherein the first layer is a thin film having a refractive index of from 1.6 to 2.6 and a geometrical film thickness of from 1.1 to 1.9 times the film thickness as an antireflection condition as obtained from the following formula; - and
the second layer is a thin film having a refractive index of from 1.4 to 1.56 and a geometrical film thickness of from 0.5 to 1.1 times the film thickness as an antireflection condition as obtained from the following formula;
d=λ
/[4n(1−
(sinθ
/n)2}1/2]wherein d is a film thickness as an antireflection condition of each layer, n is a refractive index of each layer, λ
=550 nm and θ
=60°
.
- and
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6. A substrate provided with antireflection films, which comprises a transparent substrate and first and second antireflection film layers deposited in this order on one side of the transparent substrate,
wherein the first layer is a tin oxynitride film having a geometrical film thickness of from 104 to 124 nm; - and
the second layer is a silicon oxide film having a geometrical film thickness of from 85 to 105 nm.
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7. A substrate provided with antireflection films, which comprises a transparent substrate and first, second and third antireflection film layers deposited in this order on one side of the transparent substrate,
wherein the first and second layers are thin films having compositions which are different from each other, each having a refractive index of from 1.6 to 2.5, and at least one of the first and second layers having a geometrical film thickness of from 0.04 to 0.9 time the film thickness as an antireflection condition as obtained from the following formula; - and
the third layer is a thin film having a refractive index of from 1.4 to 1.5 and a geometrical film thickness of from 0.4 to 1.1 times the film thickness as an antireflection condition as obtained from the following formula;
d=λ
/[4n(1−
(sinθ
/n)2}1/2]wherein d is a film thickness as an antireflection condition of each layer, n is a refractive index of each layer, λ
=550 nm and θ
=60°
.
- and
-
11. A substrate provided with antireflection films, which comprises a transparent substrate and first, second and third antireflection film layers deposited in this order on one side of the transparent substrate,
wherein the first layer is a tin oxynitride film having a geometrical film thickness of from 70 to 130 nm, the second layer is a titanium oxide film having a geometrical film thickness of from 1 to 25 nm, and the third layer is a silicon oxide film having a geometrical film thickness of from 80 to 130 nm.
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12. A substrate provided with antireflection films, which comprises a transparent substrate and first, second and third antireflection film layers deposited in this order on one side of the transparent substrate,
wherein the first layer is a titanium oxide film having a geometrical film thickness of from 1 to 25 nm, the second layer is a tin oxynitride film having a geometrical film thickness of from 70 to 130 nm, and the third layer is a silicon oxide film having a geometrical film thickness of from 80 to 130 nm.
Specification