Gas analyzer and a method for operating the same

• US 20020129639A1
• Filed: 02/27/2002
• Published: 09/19/2002
• Est. Priority Date: 03/17/2000
• Status: Active Grant

• Current Assignee: Peter Schastok, Walter Fabinski, Werner Thies
• Original Assignee: Peter Schastok, Walter Fabinski, Werner Thies
• Inventors: Schastok, Peter, Thies, Werner, Fabinski, Walter
• Granted Patent: US 6,484,562 B2
• Time in Patent Office: Days
• US Class Current: 73/31.05
• CPC Class Codes: G01N 21/09 adapted to resist hostile environments or corrosive or abrasive materials

Abstract

A gas analyzer having an analysis or sensor unit and having an electronic processing unit, and a method for operating such a gas analyzer. In order to achieve substantially improved safety both in handling corrosive and/or combustible and/or toxic gases in a not potentially explosive atmosphere (ex-free atmosphere), and in the operation of such an analyzer in an ex-atmosphere, the analysis or sensor unit as such is of non-explosive configuration and is arranged in a gas tight chamber around which a second chamber is arranged.

Claims

1. A gas analyzer of the type that uses the principle of optical gas analysis comprising:

(a) an appropriate measuring cuvette flowed through by a measuring gas;

said cuvette having a window region and said cuvette surrounded either only in said window region or overall by a further chamber when gas analyzer is analyzing a toxic and/or corrosive and/or combustible gas; and

(b) a processing unit.

2. The gas analyzer of claim 1 wherein said surrounding further chamber is purged with inert gas or air.

3. The gas analyzer of claim 1 wherein said surrounding further chamber has a pressure higher or lower by comparison with said cuvette.

4. The gas analyzer of claim 2 wherein said surrounding further chamber has a pressure higher or lower by comparison with said cuvette.