Method and apparatus for testing cells and batteries embedded in series/parallel systems

• US 20020180445A1
• Filed: 04/09/2002
• Published: 12/05/2002
• Est. Priority Date: 09/14/2000
• Status: Active Grant

• Current Assignee: Midtronics Incorporated
• Original Assignee: Midtronics Incorporated
• Inventors: Bertness, Kevin I., Champlin, Keith S.
• Granted Patent: US 6,906,523 B2
• Time in Patent Office: Days
• US Class Current: 324/426
• CPC Class Codes: G01R 31/385 Arrangements for measuring battery or accumulator variables for monitoring G01R31/382
• CPC Class Codes: G01R 31/389 Measuring internal impedance, internal conductance or related variables
• CPC Class Codes: G01R 31/396 Acquisition or processing of data for testing or for monitoring individual cells or groups of cells within a battery

Abstract

A “three-point” measurement technique effectively removes system effects to determine impedance, admittance, resistance, or conductance of an individual cell, battery, or interconnecting conductor embedded in a series or series-parallel electrochemical battery or fuel cell system. Three electrical contact points are defined. Two of these points bound the subject element. The third point is separated from the other two by a conducting path that may include one or more cells or batteries. By measuring dynamic parameters between alternate pairs of contact points, three dynamic parameter measurements are acquired. A mathematical computation combines the measurements and determines the dynamic parameter of a subject element as if it were alone—thus effectively “de-embedding” the subject element from the remainder of the system. A “four-point” extension of this technique permits measuring a dynamic parameter of a cell/battery disposed in a multiple-unit string of parallel-connected cells/batteries.

Claims

1. Apparatus for evaluating a dynamic parameter of an element embedded in a system of interconnected electrochemical cells or batteries, said element bounded by first and second electrical contact points, comprising:

dynamic parameter measuring circuitry simultaneously coupled to said first and second contact points and rendering a first dynamic parameter measurement, simultaneously coupled to said second contact point and to a third electrical contact point displaced on a conducting path from said second contact point and rendering a second dynamic parameter measurement, and simultaneously coupled to said third contact point and to said first contact point and rendering a third dynamic parameter measurement, and;

computation circuitry adapted to compute said dynamic parameter of said element from said first, second, and third dynamic parameter measurements.

2. Apparatus as in claim 1 wherein said computation circuitry comprises a hand calculator or computer.

3. Apparatus as in claim 1 wherein said computation circuitry comprises onboard computation circuitry.

4. Apparatus as in claim 3 including onboard memory circuitry adapted to store said first, second, and third dynamic parameter measurements for processing by said onboard computation circuitry.

5. Apparatus as in claim 1 wherein said dynamic parameter measuring circuitry includes input multiplexing circuitry simultaneously coupled to said first, second, and third electrical contact points.

6. Apparatus as in claim 1 wherein said dynamic parameter measuring circuitry couples to said first, second, and third electrical contact points with Kelvin probes.

7. Apparatus as in claim 1 wherein said dynamic parameter is complex impedance.

8. Apparatus as in claim 1 wherein said dynamic parameter is complex admittance.

9. Apparatus as in claim 1 wherein said dynamic parameter is dynamic resistance.

10. Apparatus as in claim 1 wherein said dynamic parameter is dynamic conductance.

11. Apparatus as in claim 1 wherein said element is an electrochemical cell.

12. Apparatus as in claim 1 wherein said element is an electrochemical battery.

13. Apparatus as in claim 1 where said element is an electrical conductor.

15. A method as in claim 14 wherein said first, second, and third dynamic parameter values are obtained by measurement.

16. A method as in claim 14 wherein said dynamic parameter is complex impedance.

17. A method as in claim 14 wherein said dynamic parameter is complex admittance.

18. A method as in claim 14 wherein said dynamic parameter is dynamic resistance.

19. A method as in claim 14 wherein said dynamic parameter is dynamic conductance.

20. A method as in claim 14 wherein said element is an electrochemical cell.

21. A method as in claim 14 wherein said element is an electrochemical battery.

22. A method as in claim 14 wherein said element is an electrical conductor.

23. A method as in claim 15 wherein said measurement employs Kelvin probes.

25. A method as in claim 24 wherein said first, second, third, fourth, and fifth dynamic parameter values are obtained by measurement.

26. A method as in claim 24 wherein said dynamic parameter is complex impedance.

27. A method as in claim 24 wherein said dynamic parameter is complex admittance.

28. A method as in claim 24 wherein said dynamic parameter is dynamic resistance.

29. A method as in claim 24 wherein said dynamic parameter is dynamic conductance.

30. A method as in claim 25 wherein said measurement employs Kelvin probes.

59. Apparatus for evaluating a dynamic parameter of an element embedded in a system of interconnected electrochemical cells or batteries adapted for performing the method of claim 14.

60. Apparatus for evaluating a dynamic parameter of an electrochemical cell or battery embedded internally in an array of parallel-connected electrochemical cells or batteries adapted for performing the method of claim 24.

14. A method for evaluating a dynamic parameter of an element embedded in a system of interconnected electrochemical cells or batteries, said element bounded by first and second electrical contact points, comprising:

obtaining a first dynamic parameter value existent between said first and second electrical contact points;

obtaining a second dynamic parameter value existent between said second electrical contact point and a third electrical contact point in said system;

obtaining a third dynamic parameter value existent between said third electrical contact point and said first electrical contact point; and

,

computing said dynamic parameter of said element from said first, second, and third dynamic parameter values.

24. A method for evaluating a dynamic parameter of an electrochemical cell or battery embedded internally in an array of parallel-connected electrochemical cells or batteries comprising:

obtaining a first dynamic parameter value existent between first and second contact points comprising terminals of said electrochemical cell or battery;

obtaining a second dynamic parameter value existent between said second contact point and a third contact point disposed on a first conducting path proceeding from said second contact point;

obtaining a third dynamic parameter value existent between said second contact point and a fourth contact point disposed on a second conducting path proceeding from said second contact point;

obtaining a fourth dynamic parameter value existent between said third contact point and said first contact point;

obtaining a fifth dynamic parameter value existent between said fourth contact point and said first contact point; and

,

computing said dynamic parameter of said electrochemical cell or battery from said first, second, third, fourth, and fifth dynamic parameter values.

31. A method for evaluating a dynamic parameter of an interconnecting conductor embedded internally in an array of parallel-connected electrochemical cells or batteries comprising:

obtaining a first dynamic parameter value existent between first and second contact points bounding said interconnecting conductor, said second contact point comprising a first terminal of a cell or battery;

obtaining a second dynamic parameter value existent between said second contact point and a third contact point comprising a second terminal of said cell or battery;

obtaining a third dynamic parameter value existent between said first and third contact points; and

,

computing said dynamic parameter of said interconnecting conductor from said first, second, and third dynamic parameter values.

32. A method as in claim 31 wherein said first, second, and third dynamic parameter values are obtained by measurement.

33. A method as in claim 31 wherein said dynamic parameter is complex impedance.

34. A method as in claim 31 wherein said dynamic parameter is complex admittance.

35. A method as in claim 31 wherein said dynamic parameter is dynamic resistance.

36. A method as in claim 31 wherein said dynamic parameter is dynamic conductance.

37. A method as in claim 32 wherein said measurement employs Kelvin probes.

39. Apparatus as in claim 38 wherein said computation circuitry comprises a hand calculator or computer.

40. Apparatus as in claim 38 wherein said computation circuitry comprises onboard computation circuitry.

41. Apparatus as in claim 40 including onboard memory circuitry adapted to store said first, second, and third dynamic parameter measurements for processing by said onboard computation circuitry.

42. Apparatus as in claim 38 wherein said dynamic parameter measuring circuitry includes input multiplexing circuitry simultaneously coupled to said first and second contact points and said common connecting point.

43. Apparatus as in claim 38 wherein said dynamic parameter measuring circuitry couples to said first and second contact points and to said common connecting point with Kelvin probes.

44. Apparatus as in claim 38 wherein said dynamic parameter is complex impedance.

45. Apparatus as in claim 38 wherein said dynamic parameter is complex admittance.

46. Apparatus as in claim 38 wherein said dynamic parameter is dynamic resistance.

47. Apparatus as in claim 38 wherein said dynamic parameter is dynamic conductance.

48. Apparatus as in claim 38 wherein said first and second adjacent electrical elements comprise an electrochemical cell and an interconnecting electrical conductor.

49. Apparatus as in claim 38 wherein said first and second adjacent electrical elements comprise an electrochemical battery and an interconnecting electrical conductor.

61. Apparatus for evaluating a dynamic parameter of an interconnecting conductor embedded internally in an array of parallel-connected electrochemical cells or batteries adapted for performing the method of claim 31.

38. Apparatus for evaluating dynamic parameters of first and second adjacent electrical elements having a common connecting point and embedded in a system of interconnected electrochemical cells or batteries comprising:

dynamic parameter measuring circuitry simultaneously coupled to said first element at a first contact point and said common connecting point and rendering a first dynamic parameter measurement, simultaneously coupled to said second element at a second contact point and said common connecting point and rendering a second dynamic parameter measurement, and simultaneously coupled to said first and second contact points and rendering a third dynamic parameter measurement;

computation circuitry adapted to compute said dynamic parameters of said first and second adjacent electrical elements from said first, second, and third dynamic parameter measurements.

50. A method for evaluating dynamic parameters of first and second adjacent electrical elements having a common connecting point and embedded in a system of interconnected electrochemical cells or batteries comprising:

obtaining a first dynamic parameter value existent between said common connecting point and a first contact point bounding said first electrical element;

obtaining a second dynamic parameter value existent between said common connecting point and a second contact point bounding said second electrical element;

obtaining a third dynamic parameter value existent between said first and second contact points; and

,

computing said dynamic parameters of said first and second adjacent electrical elements from said first, second, and third dynamic parameter values.

51. A method as in claim 50 wherein said first, second, and third dynamic parameter values are obtained by measurement.

52. A method as in claim 51 wherein said measurement employs Kelvin probes.

53. A method as in claim 50 wherein said dynamic parameter is complex impedance.

54. A method as in claim 50 wherein said dynamic parameter is complex admittance.

55. A method as in claim 50 wherein said dynamic parameter is dynamic resistance.

56. A method as in claim 50 wherein said dynamic parameter is dynamic conductance.

57. A method as in claim 50 wherein said first and second adjacent electrical elements comprise an electrochemical cell and an electrical conductor.

58. A method as in claim 50 wherein said first and second adjacent electrical elements comprise an electrochemical battery and an electrical conductor.

62. Apparatus for evaluating dynamic parameters of first and second adjacent electrical elements having a common connecting point and embedded in a system of interconnected electrochemical cells or batteries adapted for performing the method of claim 50.

63. Apparatus for de-embedding dynamic parameters of electrical elements embedded in a system of electrochemical cells/batteries and conductors interconnected at a plurality of interconnection points comprising:

dynamic parameter measuring circuitry including two input probes, said measuring circuitry adapted to measure a dynamic parameter of an isolated electrical element coupled between said input probes;

at least three system-contacting probes adapted to simultaneously couple to elements of said system at three or more electrical contact points;

switching circuitry interposed between said input probes and said system-contacting probes and adapted to controllably couple said input probes to selected pairs of said system-contacting probes;

control circuitry adapted to command said switching circuitry to consecutively couple different pairs of said system-contacting probes to said input probes and to command said dynamic parameter measuring circuitry to measure a dynamic parameter value during each said coupling;

memory circuitry adapted to store each said measured dynamic parameter value; and

,

computation circuitry adapted to compute one or more de-embedded dynamic parameters from said measured dynamic parameter values stored in said memory circuitry.

64. Apparatus as in claim 63 wherein said input probes comprise Kelvin input probes and said system-contacting probes comprise Kelvin system-contacting probes.

65. Apparatus as in claim 63 wherein said dynamic parameter is complex impedance.

66. Apparatus as in claim 63 wherein said dynamic parameter is complex admittance.

67. Apparatus as in claim 63 wherein said dynamic parameter is dynamic resistance.

68. Apparatus as in claim 63 wherein said dynamic parameter is dynamic conductance.

69. Apparatus as in claim 63 wherein said electrical elements include one or more electrochemical cells.

70. Apparatus as in claim 63 wherein said electrical elements include one or more electrochemical batteries.

71. Apparatus as in claim 63 wherein said electrical elements include one or more electrical conductors.

72. Apparatus as in claim 63 wherein said computation circuitry computes a de-embedded dynamic parameter from three said dynamic parameter values.

73. Apparatus as in claim 63 wherein said computation circuitry computes a de-embedded dynamic parameter from five said dynamic parameter values.

74. Apparatus as in claim 63 wherein said control circuitry and said computation circuitry comprise microprocessor or microcontroller circuitry.