Method and apparatus for analyzing a disribution

• US 20030115017A1
• Filed: 12/14/2001
• Published: 06/19/2003
• Est. Priority Date: 12/14/2001
• Status: Active Grant

• Current Assignee: Gigamax Technologies Incorporated
• Original Assignee: Wavecrest Corporation
• Inventors: Li, Peng, Wilstrup, Jan Brian, Sun, Jie
• Granted Patent: US 7,016,805 B2
• Time in Patent Office: Days
• US Class Current: 702/181
• CPC Class Codes: G06F 17/18 for evaluating statistical data , e.g. average values, frequency distributions, probability functions, regression analysis forecasting specially adapted for a specific administrative, business or logistic context G06Q10/04
• CPC Class Codes: G06F 18/2415 based on parametric or probabilistic models, e.g. based on likelihood ratio or false acceptance rate versus a false rejection rate
• CPC Class Codes: H04L 1/205 jitter monitoring

Abstract

A method, apparatus, and article of manufacture for analyzing a measurable distribution having random components and deterministic components. The method includes the steps of collecting data, constructing a probability density function based on the data such that the probability density function is a convolution of deterministic functions and random functions, constructing a probability density function based on a deterministic and random convolution model having three or more parameters wherein at least one of the parameters are unknown, and determining unknown parameters by using a deconvolution process.

Claims