System and method for testing integrated circuits by transient signal analysis
First Claim
1. A system for testing an integrated circuit (IC) by transient signal analysis comprising:
- a comparison circuit configured to generate a comparison signal from an IC transient signal and a reference signal, said IC transient signal being specific to a monitored supply voltage at said IC; and
circuitry operationally coupled to said comparison circuit, said circuitry being configured to manipulate said comparison signal to generate an output waveform, said output waveform being indicative of changes made by said circuitry to said comparison signal for determining if said IC meets said predetermined standard.
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Accused Products
Abstract
A system and method for testing an integrated circuit (IC) by transient signal analysis includes a comparison circuit that is configured to generate a comparison signal from an IC transient signal and a reference signal. Circuitry operationally coupled to the comparison circuit manipulates the comparison signal to generate a first output waveform area indicative of an absolute area of positive and negative portions within the comparison signal. The comparison circuit and the circuitry may include seven operational-amplifiers (op-amps) or ten op-amps. As a further processing sequence, a second output waveform area that is indicative of an absolute area of positive and negative portions within a second comparison signal is generated. In one embodiment, a first value representing the first waveform area and a second value representing the second waveform area are plotted to determine if the plotted X-Y coordinate falls within a predefined standard for determining the pass/fail status of the IC.
6 Citations
27 Claims
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1. A system for testing an integrated circuit (IC) by transient signal analysis comprising:
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a comparison circuit configured to generate a comparison signal from an IC transient signal and a reference signal, said IC transient signal being specific to a monitored supply voltage at said IC; and
circuitry operationally coupled to said comparison circuit, said circuitry being configured to manipulate said comparison signal to generate an output waveform, said output waveform being indicative of changes made by said circuitry to said comparison signal for determining if said IC meets said predetermined standard. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A system for determining a pass/fail status of a device under test (DUT) by transient signal analysis comprising:
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a source for providing a supply voltage to a power supply terminal of said DUT;
a comparison circuit operationally coupled to said power supply terminal, said comparison circuit being enabled to generate a comparison signal from a DUT transient signal and a reference transient signal, said DUT transient signal being monitored at said power supply terminal of said DUT; and
circuitry operationally coupled to said comparison circuit, said circuitry being enabled to identify sampling portions of said comparison signal, said sampling portions being indicative of said pass/fail status of said DUT. - View Dependent Claims (15, 16, 17, 18, 19)
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20. A method for testing an integrated circuit (IC) by transient signal analysis comprising the steps of:
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providing a transient signal specific to a monitored supply voltage to said IC;
generating a comparison signal, including comparing said IC transient signal with a reference signal;
generating an output waveform, including manipulating said comparison signal by circuitry, said output waveform being indicative of changes made by said circuitry to said comparison signal; and
determining if said IC meets a predetermined standard on a basis of said output waveform. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27)
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Specification