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Method and apparatus for monitoring the operation of a wafer handling robot

  • US 20040073336A1
  • Filed: 10/11/2002
  • Published: 04/15/2004
  • Est. Priority Date: 10/11/2002
  • Status: Active Grant
First Claim
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1. A method of monitoring the operation of a robot used to transport wafers in a semiconductor manufacturing operation, comprising the steps of:

  • (A) sensing control signals sent to said robot by a controller;

    (B) comparing characteristics of the control signals sensed in step (A) with a set of reference characteristics representing correct commands to said robot; and

    , (C) issuing an error signal based on the comparison performed in step (B).

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