Wafer bonding for three-dimensional (3D) integration
First Claim
1. A three-dimensional (3-D) integrated chip system, comprising:
- a first wafer including one or more integrated circuit (IC) devices;
a second wafer including one or more integrated circuit (IC) devices; and
a metal bonding layer deposited on opposing surfaces of the first and second wafers at designated locations to establish electrical connections between active IC devices on the first and second wafers and to provide metal bonding between the adjacent first and second wafers, when the first wafer is pressed against the second wafer using a flexible bladder press to account for height differences of the metal bonding layer across the opposing surfaces of the first and second wafers.
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Accused Products
Abstract
A three-dimensional (3-D) integrated chip system is provided with a first wafer including one or more integrated circuit (IC) devices; a second wafer including one or more integrated circuit (IC) devices; and a metal bonding layer deposited on opposing surfaces of the first and second wafers at designated locations to establish electrical connections between active IC devices on the first and second wafers and to provide metal bonding between the adjacent first and second wafers, when the first wafer is pressed against the second wafer using a flexible bladder press to account for height differences of the metal bonding layer across the opposing surfaces of the first and second wafers.
38 Citations
20 Claims
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1. A three-dimensional (3-D) integrated chip system, comprising:
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a first wafer including one or more integrated circuit (IC) devices;
a second wafer including one or more integrated circuit (IC) devices; and
a metal bonding layer deposited on opposing surfaces of the first and second wafers at designated locations to establish electrical connections between active IC devices on the first and second wafers and to provide metal bonding between the adjacent first and second wafers, when the first wafer is pressed against the second wafer using a flexible bladder press to account for height differences of the metal bonding layer across the opposing surfaces of the first and second wafers. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A wafer bonding method, comprising:
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selectively forming metallic bumps on opposing surfaces of adjacent wafers each including one or more integrated circuit (IC) devices;
selectively aligning the adjacent wafers to form a stack; and
bonding the metallic bumps on the surface of one wafer with the metallic bumps on the surface of the other wafer to establish electrical connections between active IC devices on the adjacent wafers using a flexible bladder press to account for height differences of the metallic bumps across the opposing surfaces of the adjacent wafers. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A three-dimensional (3-D) integrated chip system, comprising:
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a first wafer including one or more integrated circuit (IC) devices, and metallic bumps arranged to electrical interconnection;
a second wafer including one or more integrated circuit (IC) devices, and metallic bumps arranged for electrical interconnection and with alignment with the first wafer to form a stack; and
a flexible bladder press arranged to press the first wafer against the second wafer to bond the metallic bumps on the surface of the first wafer with the metallic bumps on the surface of the second wafer and establish electrical connections between active IC devices on the adjacent wafers. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification