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Device and system for maintaining a complex system, particularly an aircraft

  • US 20040153800A1
  • Filed: 06/18/2003
  • Published: 08/05/2004
  • Est. Priority Date: 06/19/2002
  • Status: Abandoned Application
First Claim
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1. Device for maintaining a complex system, particularly an aircraft, which comprises at least:

  • a plurality of electronic equipments (4A, 4B, 4C) which are mounted on said complex system, each of said electronic equipments (4A, 4B, 4C) comprising;

    at least one built-in test means (5A, 5B, 5C) for detecting a fault while the complex system is in operation;

    at least one first test memory (6A, 6B, 6C) for recording, when a fault is detected by said test means (5A, 5B, 5C), information relating to this fault; and

    an interface (7A, 7B, 7C) providing access to said first test memory (6A, 6B, 6C); and

    a central unit (8) mounted on said complex system, connected to said electronic equipments (4A, 4B, 4C) and which comprises;

    at least one built-in test means (10) for detecting a fault while the complex system is in operation;

    at least one second test memory (11) for recording, when a fault is detected by said test means (10), information relating to this fault;

    a computer (12) which receives, when a fault is detected, information from said electronic equipments (4A, 4B, 4C) indicating the test means that detected the fault, which attempts to determine, from this information, at least one faulty element in said complex system and which is able to indicate on a display screen (16, 17);

    while the complex system is operating, automatically, the occurrence of a fault and, if it has been determined, the corresponding faulty element; and

    at the end of operation of the complex system, on request, a list of the faults that occurred during operation, with the corresponding faulty elements;

    at least one maintenance memory (13) for recording all the information processed by said computer (12); and

    at least one interface (14, 15) providing access to said second test memory (11) and to said maintenance memory (13).

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