×

Method and apparatus for measuring assembly and alignment errors in sensor assemblies

  • US 20040170314A1
  • Filed: 12/20/2002
  • Published: 09/02/2004
  • Est. Priority Date: 12/20/2002
  • Status: Active Grant
First Claim
Patent Images

1. A target for measuring assembly and alignment errors in a multi-segment sensor assembly, the target comprising:

  • a) a background;

    b) at least two marks that contrast with the background, each mark positioned such that it can be detected by only one segment of the multi-segment sensor assembly; and

    c) an operative vertical edge on each mark.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×