Multi-fixture assembly of cutting tools

• US 20040181927A1
• Filed: 03/17/2003
• Published: 09/23/2004
• Est. Priority Date: 03/17/2003
• Status: Active Grant

• Current Assignee: MEMX, Inc. (Lumentum Holdings Inc.)
• Original Assignee: MEMX, Inc. (Lumentum Holdings Inc.)
• Inventors: Rodgers, Murray Steven, Miller, Samuel Lee, Smith, Norman Frank
• Granted Patent: US 6,993,818 B2
• Time in Patent Office: Days
• US Class Current: 29/458
• CPC Class Codes: A61B 17/3211 Surgical scalpels, knives; Accessories therefor
• CPC Class Codes: A61F 9/013 Instruments for compensation of ocular refraction A61F9/008 takes precedence; Instruments for use in cornea removal, for reshaping or performing incisions in the cornea
• CPC Class Codes: A61F 9/0133 Knives or scalpels specially adapted therefor
• CPC Class Codes: B26B 29/06 Arrangements for guiding hand cutting tools guiding equipment or arrangements for specific cutting tools, see the particular places, e.g. for hair trimming devices A45D24/36, for saw blades B27B11/02, B26B13/10
• CPC Class Codes: B26B 9/00 Blades for hand knives
• CPC Class Codes: Y10T 29/49885 with coating before or during assembling
• CPC Class Codes: Y10T 29/49895 Associating parts by use of aligning means [e.g., use of a drift pin or a "fixture"]
• CPC Class Codes: Y10T 29/49904 Assembling a subassembly, then assembling with a second subassembly
• CPC Class Codes: Y10T 29/49995 Shaping one-piece blank by removing material
• CPC Class Codes: Y10T 29/49996 Successive distinct removal operations

Abstract

A method for providing a cutting tool (20) is disclosed. Multiple cutting blades (56) are fabricated from a wafer (130). This wafer (130) is disposed on a blade handle mounting fixture (224) such that a blade handle (24) may be mounted on each of the individual blades (56). A cutting edge (80) of each blade (56) is maintained in spaced relation to the fixture (224) as these blade handles (24) are being mounted. Thereafter, the wafer (130) is transferred to a blade separation fixture (300). Each blade 56 is suspended above the fixture (300). An appropriate force is transmitted to the individual blades (56) to separate the same from the wafer (130). Separation preferably occurs before the blade (56) contacts the fixture (300). Thereafter, the blade (56) in effect pivots into an inclined position where its cutting edge (80) project at least generally upwardly. Preferably, at no time does the cutting edge (80) of any blade (56) contact either the blade handle mounting fixture (224) or the blade separation fixture (300).

Claims

1. A method for assembling a cutting tool, comprising the steps of:

executing a first positioning step comprising positioning a wafer on a first fixture, wherein said wafer comprises a first blade;

mounting a first blade handle on said first blade while said wafer is on said first fixture;

removing said wafer from said first fixture after said mounting step;

executing a second positioning step comprising positioning said wafer on a second fixture;

separating said first blade from a remainder of said wafer while said wafer is on said second fixture, wherein said separating step is executed after said mounting step.

2. A method, as claimed in claim 1, wherein:

said first positioning step comprises positioning said wafer in a first recess formed on an upper surface of said first fixture, and wherein said second positioning step comprises positioning said wafer in a second recess formed on an upper surface of said second fixture.

3. A method, as claimed in claim 2, wherein:

a perimeter of both said first and second recesses at least substantially approximates a perimeter of said wafer.

4. A method, as claimed in claim 1, wherein:

said wafer comprises a lower surface, wherein each of said first and second positioning steps comprises disposing less than an entirety of said lower surface of said wafer in contact with said first and second fixtures, respectively.

5. A method, as claimed in claim 1, further comprising the step of:

biasing said wafer toward said first fixture when said wafer is on said first fixture, and biasing said wafer toward said second fixture when said wafer is on said second fixture.

6. A method, as claimed in claim 5, wherein:

each said biasing step comprises using a vacuum.

7. A method, as claimed in claim 1, further comprising the steps of:

retaining said wafer on said first fixture using a vacuum, and retaining said wafer on said second fixture using a vacuum.

8. A method, as claimed in claim 1, further comprising the step of:

maintaining a first cutting edge of said first blade in spaced relation to said first fixture.

9. A method, as claimed in claim 8, wherein:

said maintaining step comprises disposing said first cutting edge of said first blade above a first cutting edge cavity formed on an upper surface of said first fixture.

10. A method, as claimed in claim 8, wherein:

said maintaining step is executed throughout said mounting step.

11. A method, as claimed in claim 1, wherein:

said wafer comprises a first score associated with said first blade, wherein said first positioning step comprises supporting said wafer with said first fixture directly under said first score, wherein said separating step utilizes said first score.

12. A method, as claimed in claim 11, further comprising the step of:

aligning said first score with a predetermined crystal plane of said wafer.

13. A method, as claimed in claim 1, wherein:

said wafer comprises a first score associated with said first blade, wherein said first positioning step comprises supporting said wafer such that said mounting step does not result in any net moment about said first score.

14. A method, as claimed in claim 1, wherein:

said wafer comprises a first cantilever, wherein said first blade is disposed on an end of said first cantilever, wherein said first positioning step comprises supporting said first cantilever with said first fixture.

15. A method, as claimed in claim 14, wherein:

said first positioning step comprises inhibiting any deflection of said first cantilever during said mounting step.

16. A method, as claimed in claim 1, wherein:

said mounting step comprises maintaining said first blade handle in spaced relation with an entirety of said first fixture.

17. A method, as claimed in claim 1, wherein:

said mounting step comprises applying an adhesive to at least one of said first blade handle and said first blade.

18. A method, as claimed in claim 17, wherein:

said adhesive is light curable, wherein said method further comprises disposing said first blade handle in a predetermined position relative to said first blade after said applying step, and thereafter exposing at least a portion of said adhesive to light to fix said first blade handle to said first blade.

19. A method, as claimed in claim 1, wherein:

said mounting step comprises disposing a first registrant extending from a lower surface of said first blade handle into a first registration cavity accessible through an upper surface of said first blade.

20. A method, as claimed in claim 19, wherein:

said disposing step comprises maintaining said first registrant in spaced relation with said first fixture.

21. A method, as claimed in claim 19, wherein:

said disposing step comprises directing said first registrant of said first blade handle toward a first registrant cavity formed on an upper surface of said first fixture that is aligned with said first registrant.

22. A method, as claimed in claim 1, wherein:

said mounting step comprises disposing first and second registrants extending from a lower surface of said first blade handle into first and second registration cavities accessible through an upper surface of said first blade.

23. A method, as claimed in claim 22, wherein:

said disposing step comprises supporting said first blade with said first fixture between said first and second registration cavities.

24. A method, as claimed in claim 1, wherein:

said mounting step comprises;

disposing said first blade handle on an upper surface of said first blade;

executing a first moving step comprising moving said first blade handle relative to said first blade after said disposing step; and

terminating said first moving step upon registering said first blade handle to said first blade.

25. A method, as claimed in claim 24, wherein:

said disposing step comprises moving said first blade handle in a first direction toward said first blade, and wherein said first moving step comprises moving said blade handle in a second direction that is at least generally perpendicular to said first direction.

26. A method, as claimed in claim 24, wherein:

said first moving step comprises moving said first blade handle at least generally away from said first cutting edge of said first blade.

27. A method, as claimed in claim 24, wherein:

said first moving step comprises moving said first blade handle in a direction that is at least generally parallel to said upper surface of said first blade.

28. A method, as claimed in claim 24, wherein:

said registering step comprises a first registrant of said first blade handle engaging a first registration surface of said first blade.

29. A method, as claimed in claim 24, further comprising the step of:

securing said first blade handle to said first blade after said terminating step.

30. A method, as claimed in claim 1, wherein:

said wafer comprises a plurality of said first blades, wherein said method further comprises repeating said mounting step for each of said plurality of said first blades before said removing step.

31. A method, as claimed in claim 1, further comprising the step of:

maintaining a first cutting edge of said first blade in spaced relation to said second fixture.

32. A method, as claimed in claim 31, wherein:

said maintaining step comprises disposing said first cutting edge of said first blade above a first cutting edge cavity formed on an upper surface of said second fixture.

33. A method, as claimed in claim 31, further comprising the step of:

seating said first blade on said second fixture after said separating step, wherein said maintaining step is executed throughout an entirety of said separating step, from an end of said separating step to a start of said seating step, and throughout an entirety of said seating step.

34. A method, as claimed in claim 31, further comprising the step of:

executing a second maintaining step comprising maintaining said first cutting edge of said first blade in spaced relation to said first fixture.

35. A method, as claimed in claim 34, wherein:

said second maintaining step comprises disposing said first cutting edge of said first blade above a first cutting edge cavity formed on an upper surface of said first fixture.

36. A method, as claimed in claim 34, wherein:

said second maintaining step is executed throughout both said mounting step, wherein said first cutting edge never contacts either said first fixture or said second fixture.

37. A method, as claimed in claim 1, further comprising the steps of:

maintaining a first cutting edge of said first blade in spaced relation to said first fixture throughout said mounting step; and

maintaining said first cutting edge of said first blade in spaced relation to said second fixture both throughout and after said separating step.

38. A method, as claimed in claim 1, further comprising the steps of:

seating said first blade on said second fixture after said separating step; and

maintaining a first cutting edge of said first blade in spaced relation to said second fixture throughout said separating step, from an end of said separating step to a start of said seating step, and throughout an entirety of said seating step.

39. A method, as claimed in claim 1, wherein:

said second positioning step comprises disposing an entirety of said first blade in spaced relation with said second fixture.

40. A method, as claimed in claim 1, wherein:

said second positioning step comprises suspending said first blade above said second fixture.

41. A method, as claimed in claim 40, wherein:

said wafer comprises a first cantilever, wherein said first blade is disposed on an end of said first cantilever, wherein said second positioning step comprises supporting at least a portion of said first cantilever with said second fixture.

42. A method, as claimed in claim 40, wherein:

said wafer further comprises a first blade support tab, wherein said first blade is disposed on an end of said first blade support tab, wherein said second positioning step comprises supporting at least a portion of said first blade support tab with said second fixture.

43. A method, as claimed in claim 1, wherein:

said separating step comprises fracturing said wafer.

44. A method, as claimed in claim 1, wherein:

said separating step is executed at least substantially along a line that is at least substantially parallel with said first cutting edge.

45. A method, as claimed in claim 1, wherein:

said wafer comprises a first score associated with said first blade, wherein said separating step comprises fracturing said wafer at least substantially along said first score.

46. A method, as claimed in claim 45, wherein:

said second positioning step comprises supporting said wafer proximate to said first score, while an entirety of said first blade is disposed in spaced relation to said second fixture.

47. A method, as claimed in claim 1, wherein:

said separating step comprises deflecting said first blade in a direction of said second fixture.

48. A method, as claimed in claim 1, wherein:

said separating step is executed with a first handle mounted on said first blade.

49. A method, as claimed in claim 48, wherein:

said separating step comprises applying a force on said first handle that is at least generally directed toward said first fixture.

50. A method, as claimed in claim 1, wherein:

said separating step comprises applying a force directly on said first blade that is at least generally directed toward said first fixture.

51. A method, as claimed in claim 1, wherein:

said separating step is completed before any portion of said first blade contacts said second fixture.

52. A method, as claimed in claim 1, wherein:

said separating step comprises executing a first moving step, wherein said method further comprises the step of executing a second moving step, wherein said first moving step comprises moving a first cutting edge of said first blade at least generally toward said second fixture without having said first cutting edge actually contact said second fixture, and wherein said second moving step comprises moving said first cutting edge of said first blade at least generally away from said second fixture before said first moving step causes said first cutting edge to contact said second fixture.

53. A method, as claimed in claim 1, further comprising the steps of:

moving said first blade into contact with said second fixture after said separating step, and then pivoting said first blade to direct a first cutting edge of said first blade at least generally away from said second fixture.

54. A method, as claimed in claim 1, further comprising the step of:

disposing a lower surface of said first blade against a first surface of said second fixture after said separating step such that a rear edge of said first blade is disposed at a lower elevation relative to a first cutting edge of said first blade, wherein said first surface is both inclined and planar.

55. A method, as claimed in claim 54, further comprising the step of:

retaining said first blade against said first surface.

56. A method, as claimed in claim 55, wherein:

said retaining step comprises using a vacuum.

57. A method, as claimed in claim 1, wherein:

said wafer comprises a plurality of said first blades, wherein said method further comprises repeating said separating step for each of said plurality of said first blades, and thereafter removing said wafer from said second fixture.

58. A method, as claimed in claim 1, wherein said wafer comprises a plurality of said first blades, wherein said method further comprises the steps of:

repeating said mounting step for each of said plurality of said first blades before said removing step;

repeating said separating step for each of said plurality of said first blades; and

removing said wafer from said second fixture after every said first blade has been separated from said wafer.