High-voltage device having a measuring resistor

• US 20050036344A1
• Filed: 08/10/2004
• Published: 02/17/2005
• Est. Priority Date: 08/14/2003
• Status: Active Grant

• Current Assignee: GE Medical Systems Global Technology Company LLC (GE Healthcare Technologies, Inc.)
• Original Assignee: GE Medical Systems Global Technology Company LLC (GE Healthcare Technologies, Inc.)
• Inventors: Perillat-Amede, Denis, Abonneau, Laurence, Baptiste, Georges William
• Granted Patent: US 7,379,312 B2
• Time in Patent Office: Days
• US Class Current: 363/59
• CPC Class Codes: H05G 1/10 Power supply arrangements for feeding the X-ray tube supply circuits with converters in general H02M; supply circuits for emitters and amplifiers H04B1/16 - H04B1/1623
• CPC Class Codes: H05G 1/265 Measurements of current, voltage or power

Abstract

A high-voltage device having a measuring resistor, also called a bleeder, is plunged into an electrical field whose voltage varies in the same way as the voltage along the bleeder. To achieve this, the capacitive elements are distributed in two rows, each row defining a plane. Along each row, the potentials are growing. The space between the two rows is sufficient for the bleeder to be placed therein. The bleeder is formed either by series-connected resistors or by a screen-printed resistor.

Claims

1. A high-voltage device comprising:

several capacitors and at least one internal resistor for the measurement of high voltage;

wherein the capacitors are aligned so as to form at least two parallel planes; and

the measuring resistor is distributed between the two planes.

2. The device according to claim 1 comprising no element dedicated specifically to the shielding of the measuring resistor.

3. The device according to claim 1 wherein the measuring resistor is formed by several discrete resistive components.

4. The device according to claim 2 wherein the measuring resistor is formed by several discrete resistive components.

5. The device according to claim 1 wherein the measuring resistor is formed by a component screen-printed on a plate.

6. The device according to claim 2 wherein the measuring resistor is formed by a component screen-printed on a plate.

7. The device according to claim 1 wherein a capacitive assembly is used, equivalent to the theoretical capacitances of the high-voltage production device, the capacitors of the capacitive assembly being aligned to form the at least two planes.

8. The device according to claim 2 wherein a capacitive assembly is used, equivalent to the theoretical capacitances of the high-voltage production device, the capacitors of the capacitive assembly being aligned to form the at least two planes.

9. The device according to claim 3 wherein a capacitive assembly is used, equivalent to the theoretical capacitances of the high-voltage production device, the capacitors of the capacitive assembly being aligned to form the at least two planes.

10. The device according to claim 5 wherein a capacitive assembly is used, equivalent to the theoretical capacitances of the high-voltage production device, the capacitors of the capacitive assembly being aligned to form the at least two planes.

11. The device according to claim 1 wherein the capacitive elements are connected in such a way that the high voltage increases gradually along the at least two planes.

12. The device according to claim 2 wherein the capacitive elements are connected in such a way that the high voltage increases gradually along the at least two planes.

13. The device according to claim 3 wherein the capacitive elements are connected in such a way that the high voltage increases gradually along the at least two planes.

14. The device according to claim 5 wherein the capacitive elements are connected in such a way that the high voltage increases gradually along the at least two planes.

15. The device according to claim 7 wherein the capacitive elements are connected in such a way that the high voltage increases gradually along the at least two planes.

16. The device according to claim 1 wherein the high-voltage production device is a doubler circuit.

17. The device according to claim 2 wherein the high-voltage production device is a doubler circuit.

18. The device according to claim 3 wherein the high-voltage production device is a doubler circuit.

19. The device according to claim 5 wherein the high-voltage production device is a doubler circuit.

20. The device according to claim 7 wherein the high-voltage production device is a doubler circuit.

21. The device according to claim 11 wherein the high-voltage production device is a doubler circuit.

22. The device according to claim 1 wherein the high-voltage production device is a Crockcroft-Walton multiplier circuit.

23. The device according to claim 2 wherein the high-voltage production device is a Crockcroft-Walton multiplier circuit.

24. The device according to claim 3 wherein the high-voltage production device is a Crockcroft-Walton multiplier circuit.

25. The device according to claim 5 wherein the high-voltage production device is a Crockcroft-Walton multiplier circuit.

26. The device according to claim 7 wherein the high-voltage production device is a Crockcroft-Walton multiplier circuit.

27. The device according to claim 11 wherein the high-voltage production device is a Crockcroft-Walton multiplier circuit.

28. The device according to claim 1 wherein the high-voltage production device is a Heafely multiplier circuit.

29. The device according to claim 2 wherein the high-voltage production device is a Heafely multiplier circuit.

30. The device according to claim 3 wherein the high-voltage production device is a Heafely multiplier circuit.

31. The device according to claim 5 wherein the high-voltage production device is a Heafely multiplier circuit.

32. The device according to claim 7 wherein the high-voltage production device is a Heafely multiplier circuit.

33. The device according to claim 11 wherein the high-voltage production device is a Heafely multiplier circuit.

34. The device according to claim 1 wherein the measuring resistor is alone between the two planes.

35. The device according to claim 2 wherein the measuring resistor is alone between the two planes.

36. The device according to claim 3 wherein the measuring resistor is alone between the two planes.

37. The device according to claim 5 wherein the measuring resistor is alone between the two planes.

38. The device according to claim 7 wherein the measuring resistor is alone between the two planes.

39. The device according to claim 11 wherein the measuring resistor is alone between the two planes.

40. The device according to claim 16 wherein the measuring resistor is alone between the two planes.

41. The device according to claim 22 wherein the measuring resistor is alone between the two planes.

42. The device according to claim 24 wherein the measuring resistor is alone between the two planes.

43. A high voltage device comprising:

a plurality of capacitive elements;

at least one resistor for the measurement of high voltage;

the capacitive elements being wired to the resistor to generate an electrical field for which the potential is similar to a field generated during steady state operation of the resistor alone.

44. The device according to claim 43 wherein the capacitive elements are arranged in at least two parallel rows, each row defining a plane separated by a space;

and

the resistor is disposed in the space.

45. The device according to claim 44 wherein the capacitive elements are connected so that high voltage increases gradually along the at least two planes formed by the capacitive elements.

46. The device according to claim 44 wherein the measuring resistor is alone between the at least two planes formed by the capacitive elements.

47. The device according to claim 43 comprising no element specifically dedicated to shielding the resistor.