Electronic probe extender

• US 20050037649A1
• Filed: 08/13/2003
• Published: 02/17/2005
• Est. Priority Date: 08/13/2003
• Status: Active Grant

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Agilent Technologies, Inc.
• Inventors: Johnson, Kenneth W., LaMeres, Brock J.
• Granted Patent: US 7,025,628 B2
• Time in Patent Office: Days
• US Class Current: 439/169
• CPC Class Codes: G01R 1/06788 Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18
• CPC Class Codes: H01R 11/18 End pieces terminating in a probe
• CPC Class Codes: H01R 2201/20 for testing or measuring purposes
• CPC Class Codes: H01R 31/06 Intermediate parts for linking two coupling parts, e.g. adapter with a holder adapted for supporting apparatus to which its counterpart is attached H01R33/94

Abstract

An electronic probe extender. In representative embodiments, an electronic probe extender is disclosed which includes a probe connector that is capable of electronic contact to an electronic test probe, an electronic signal conductor connected electronically to the probe connector, and an electronic probe tip connected electronically to the signal conductor. The electronic probe tip includes a tapered electronically conductive tip. The electronic probe tip is capable of electronic connection to an electronic test point.

Claims

1. An electronic probe extender, comprising:

a probe connector capable of electronic contact to an electronic test probe;

an electronic signal conductor connected electronically to the probe connector; and

an electronic probe tip connected electronically to the electronic signal conductor, wherein the electronic probe tip comprises a tapered electronically conductive tip, wherein the electronic probe tip is capable of electronic connection to an electronic test point, wherein the tapered electronically conductive tip comprises at least one ridge, and wherein the electronic signal conductor is flexible.

4. The electronic probe extender of claim 1, wherein the probe connector is further encased in an external insulating layer.

5. The electronic probe extender of claim 1, wherein the electronic signal conductor is further encased in an external insulating layer.

6. The electronic probe extender of claim 1, wherein the tip extension is further encased in an external insulating layer.

8. The electronic probe extender of claim 1, wherein electronic and mechanical connection of the electronic test probe to the probe connector is obtainable by means of a press fit of the electronic test probe tip into a cavity in the probe connector.

9. The electronic probe extender of claim 8, wherein the cavity is circular in cross-section.

10. The electronic probe extender of claim 1, further comprising an electronic test probe, wherein the electronic test probe is electronically connected to the probe connector.

2-3. -3. (Cancelled):

7. (Cancelled):

11-12. -12. (Cancelled):

13. An electronic probe extender, comprising:

a probe connector capable of electronic contact to an electronic test probe;

an electronic signal conductor connected electronically to the probe connector;

an electronic probe tip connected electronically to the electronic signal conductor, wherein the electronic probe tip comprises a tapered electronically conductive tip, wherein the electronic probe tip is capable of electronic connection to an electronic test point, wherein the tapered electronically conductive tip comprises at least one ridge, and wherein the electronic signal conductor is flexible; and

a tip extension, wherein the tip extension is interposed between the tapered electronically conductive tip and the electronic signal conductor and wherein the tip extension is capable of transferring an electronic signal from the tapered electronically conductive tip to the electronic signal conductor.

14. The electronic probe extender of claim 13, wherein the probe connector is further encased in an external insulating layer.

15. The electronic probe extender of claim 13, wherein the electronic signal conductor is further encased in an external insulating layer.

16. The electronic probe extender of claim 13, wherein the tip extension is further encased in an external insulating layer.

17. The electronic probe extender of claim 13, wherein electronic and mechanical connection of the electronic test probe to the probe connector is obtainable by means of a press fit of the electronic test probe tip into a cavity in the probe connector.

18. The electronic probe extender of claim 17, wherein the cavity is circular in cross-section.

19. The electronic probe extender of claim 13, further comprising an electronic test probe, wherein the electronic test probe is electronically connected to the probe connector.

20. An electronic probe extender, comprising:

a probe connector capable of electronic contact to an electronic test probe;

an electronic signal conductor connected electronically to the probe connector;

an electronic probe tip connected electronically to the electronic signal conductor, wherein the electronic probe tip comprises a tapered electronically conductive tip, wherein the electronic probe tip is capable of electronic connection to an electronic test point, wherein the tapered electronically conductive tip comprises at least one ridge, wherein the electronic signal conductor is flexible, and wherein electronic and mechanical connection of the electronic test probe to the probe connector is obtainable by means of a press fit of the electronic test probe tip into a cavity in the probe connector; and

a tip extension, wherein the tip extension is interposed between the tapered electronically conductive tip and the electronic signal conductor and wherein the tip extension is capable of transferring an electronic signal from the tapered electronically conductive tip to the electronic signal conductor.

21. The electronic probe extender of claim 20, wherein the probe connector is further encased in an external insulating layer.

22. The electronic probe extender of claim 20, wherein the electronic signal conductor is further encased in an external insulating layer.

23. The electronic probe extender of claim 20, wherein the tip extension is further encased in an external insulating layer.

24. The electronic probe extender of claim 20, wherein the cavity is circular in cross-section.

25. The electronic probe extender of claim 20, further comprising an electronic test probe, wherein the electronic test probe is electronically connected to the probe connector.