Interferometric modulator and display unit
First Claim
Patent Images
1. An interferometric modulator comprising:
- a transparent substrate (refractive index;
no);
an optical thin film (complex index of refraction;
N1=n1−
i·
k1) provided on said transparent substrate; and
an absorber layer (complex index of refraction;
Ns=ns−
i ·
ks) opposed to said optical thin film, the distance of a gap to said optical thin film being variable;
wherein the following relation is satisfied,
n1>
n0, k1≅
0 and ns>
n0.
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Abstract
The interferometric modulator of the invention includes a transparent substrate (refractive index: n0) 12, an optical thin film (complex index of refraction: N1=n1−i·k1) 13 provided on the transparent substrate 12, and an absorber layer (complex index of refraction: Ns=ns−i·ks) 14 opposed to the optical thin film 13, the distance of a gap to the optical thin film 13 being variable, wherein the relation n1>n0, k1≅0 and ns>n0 is satisfied.
271 Citations
37 Claims
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1. An interferometric modulator comprising:
-
a transparent substrate (refractive index;
no);
an optical thin film (complex index of refraction;
N1=n1−
i·
k1) provided on said transparent substrate; and
an absorber layer (complex index of refraction;
Ns=ns−
i ·
ks) opposed to said optical thin film, the distance of a gap to said optical thin film being variable;
wherein the following relation is satisfied,
n1>
n0, k1≅
0 and ns>
n0. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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21. An interferometric modulator comprising:
-
a transparent substrate (refractive index;
η
0);
a stacked-layer film provided on said transparent substrate; and
an absorber layer (complex index of refraction;
η
s=ns−
i ·
ks) opposed to said stacked-layer film, the distance of a gap to said stacked-layer film being variable;
wherein assuming that said stacked-layer film has three or more transparent thin film layers, the complex indexes of refraction of two adjacent transparent thin film layers being mutually different, the complex index of refraction of said j-th thin film layer from the side nearest to said transparent substrate is η
j=nj−
i·
kj, the phase film thickness is δ
j, and B and C are given by the following expression (5),kj≅
0, and in a visible wavelength region (380 nm<
λ
<
780 nm), the following expression (6) is satisfied, - View Dependent Claims (22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37)
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Specification