LED array having array-based LED detectors

• US 20050230600A1
• Filed: 03/30/2005
• Published: 10/20/2005
• Est. Priority Date: 03/30/2004
• Status: Active Grant

• Current Assignee: Phoseon Technology, Inc.
• Original Assignee: Phoseon Technology, Inc.
• Inventors: Anderson, Duwayne R., Olson, Steven J., Culter, Robert G., Owen, Mark D.
• Granted Patent: US 7,816,638 B2
• Time in Patent Office: Days
• US Class Current: 250/214.100
• CPC Class Codes: H05B 45/12 using optical feedback
• CPC Class Codes: H05B 45/18 using temperature feedback
• CPC Class Codes: H05B 45/46 having LEDs disposed in parallel lines

Abstract

The present invention provides an optical system having an array of light emitting semiconductor devices to performing an operation that have multiple characteristics associated with performing the operation. The array includes at least one detector located within the array to selectively monitor multiple characteristics of the light emitting semiconductor devices and is configured to generate a signal corresponding to the selected characteristic. A controller is configured to control the light emitting semiconductor devices in response to the signal from the at least one detector. At least one of the multiple characteristics may be concentrated at an area of the array and the at least one detector may be located within the array at the area of the array to selectively monitor characteristic that is concentrated at the area of the array.

Claims

1. An optical system, comprising:

an array of semiconductor devices for performing an operation, the semiconductor devices having multiple characteristics associated with performing the operation,

at least one detector located within the array to selectively monitor multiple characteristics of the semiconductor devices, the at least one detector configured to generate a signal corresponding to the selected characteristic, and

a controller configured to control the semiconductor devices in response to the signal from the at least one detector.

2. The optical system of claim 1, wherein the at least one detector is configured to operate in a first mode to monitor a first of the multiple characteristics of the semiconductor devices and a second mode to monitor a second of the multiple characteristics of the semiconductor devices.

3. The optical system of claim 2, wherein the semiconductor devices produce a radiant output to perform the operation, such that production of the radiant output generates heat, wherein the radiant output is the first of the multiple characteristics of the semiconductor devices and heat is the second of the multiple characteristics of the semiconductor devices.

4. The optical system of claim 1, wherein at least one of the multiple characteristics is concentrated at an area of the array, wherein the at least one detector is located at the area within the array to monitor the at least one of the multiple characteristics.

5. The optical system of claim 4, wherein the at least one of the multiple characteristics is radiant output of the semiconductor devices.

6. The optical system of claim 4, wherein the at least one of the multiple characteristics is heat.

7. The optical system of claim 1, wherein the at least one detector is configured to emit light.

8. The optical system of claim 1, wherein at least one characteristic of the reacting material is monitored by at least one detector in the array.

9. An optical system, comprising:

an array of semiconductor devices for performing an operation, the semiconductor devices having multiple characteristics associated with performing the operation, wherein at least one of the multiple characteristics is concentrated at an area of the array,

at least one detector located within the array at the area of the array to selectively monitor multiple characteristics of the semiconductor devices, the at least one detector configured to generate a signal corresponding to the selected characteristic, and

a controller configured to control the semiconductor devices in response to the signal from the at least one detector.

10. The optical system of claim 9, wherein the at least one detector is configured to operate in a first mode to monitor a first of the multiple characteristics of the semiconductor devices and a second mode to monitor a second of the multiple characteristics of the semiconductor devices.

11. The optical system of claim 10, wherein the at least one of the multiple characteristics is radiant output of the semiconductor devices.

12. The optical system of claim 10, wherein the at least one of the multiple characteristics is heat.

13. An optical array, comprising:

a plurality of semiconductor devices mounted on a substrate to produce a radiant output to perform an operation, wherein at least one semiconductor device is constructed and arranged to measure the radiant output of the array and heat generated by the semiconductor devices.

14. The optical array of claim 13, wherein the at least one semiconductor device is located within the array to measure the radiant output and heat at a selected location in the array.

15. The optical array of claim 13, wherein the at least one semiconductor device is configured to operate in a first mode to monitor the radiant output and a second mode to monitor heat.

16. An optical system, comprising:

an array of semiconductor devices for performing an operation,

at least one thermal diode located within the array to monitor heat generated by the semiconductor devices, and

a controller configured to control the semiconductor devices in response to the signal from the at least one thermal diode.

17. A method of controlling an optical system, comprising:

providing an array of semiconductor devices for performing an operation, semiconductor devices having multiple characteristics associated with performing the operation,

providing at least one detector located within the array to selectively monitor multiple characteristics of the semiconductor devices, the at least one detector configured to generate a signal corresponding to the selected characteristic, and

providing a controller configured to control the semiconductor devices in response to the signal from the at least one detector.

18. The method of claim 17, further comprising operating the at least one detector in a first mode to monitor a first of the multiple characteristics of the semiconductor devices and operating the at least one detector in a second mode to monitor a second of the multiple characteristics of the semiconductor devices.

19. The method of claim 18, wherein the semiconductor devices produce a radiant output to perform the operation, such that production of the radiant output generates heat, wherein the radiant output is the first of the multiple characteristics of the semiconductor devices and heat is the second of the multiple characteristics of the semiconductor devices.

20. The method of claim 17, wherein at least one of the multiple characteristics is concentrated at an area of the array, wherein the at least one detector is located at the area within the array to monitor the at least one of the multiple characteristics.

21. The method of claim 20, wherein the at least one of the multiple characteristics is radiant output of semiconductor devices.

22. The method of claim 20, wherein the at least one of the multiple characteristics is heat.

23. An optical system, comprising:

an array of semiconductor devices, wherein the array includes one or more semiconductor devices that are electrically coupled to act as a detector.

24. The optical system of claim 23, wherein the detector detects one of radiant output, temperature, electromagnetism, and vibration.