Aid device for inspection system and display method therefor

• US 20050288881A1
• Filed: 05/18/2005
• Published: 12/29/2005
• Est. Priority Date: 05/18/2004
• Status: Abandoned Application

• Current Assignee: Omron Corporation
• Original Assignee: Omron Corporation
• Inventors: Hori, Masaki
• Application Number:
  US11/132,730
• Publication Number:
  US 20050288881A1
• Time in Patent Office: Days
• US Class Current: 702/82
• CPC Class Codes: G01D 1/14 giving a distribution function of a value, i.e. number of times the value comes within specified ranges of amplitude
• CPC Class Codes: G01D 1/18 with arrangements for signalling that a predetermined value of an unspecified parameter has been exceeded G01D1/14 takes precedence
• CPC Class Codes: G01N 29/14 using acoustic emission techniques echo of particles G01N29/046; measuring mechanical vibrations or acoustic waves in solids in general G01H1/00
• CPC Class Codes: G01N 29/42 by frequency filtering or by tuning to resonant frequency
• CPC Class Codes: G01N 29/4427 with stored values, e.g. threshold values
• CPC Class Codes: G01N 29/46 by spectral analysis, e.g. Fourier analysis or wavelet analysis spectral signal processing per se G06F17/14

Abstract

An aid device is set to an inspection system for obtaining waveform data from an inspection object, calculating a value of a characteristic quantity that characterizes the inspection object and making a judgment whether the inspection object is normal or abnormal. The aid device selects one or more characteristic quantities and one or more parameters, calculates a value by using specified combinations of the selected characteristic quantities and parameters to obtain calculation results, and displays a graph based on each of the calculation results for the specified combinations. The graph has at least two axes, each representing a characteristic quantity set or a parameter set and makes a display by varying density, color, height or size corresponding to the results of the calculation.

Claims

1. An aid device for an inspection system, said inspection system serving to obtain waveform data from an inspection object, to calculate a value of a characteristic quantity that characterizes said inspection object and to thereby make a judgment whether said inspection object is normal or abnormal, said aid device comprising:

selecting means for selecting one or more characteristic quantities and one or more parameters;

calculating means for calculating a value for given waveform data by using specified combinations of the selected characteristic quantities and parameters; and

display means for displaying a graph based on results of calculation by said calculating means, said graph having at least two axes, each of said two axes being formed by one selected from the group consisting of said one or more characteristic quantities and said one or more parameters selected by said selecting means;

wherein said aid device serves to determine at least either of an effective characteristic quantity for said judgment and a parameter for calculating a value of said effective characteristic quantity.

2. The aid device of claim 1 wherein said waveform data consist of two object waveform data for comparison;

wherein said calculating means calculates values specified characteristic quantities for said two object waveform data by using said specified combinations to obtain calculation results and carries out comparison calculation between said calculation results; and

wherein said graph displayed by said display means is based on results of said comparison calculation.

3. The aid device of claim 2 wherein said graph makes a display by varying one selected from the group consisting of density, color, height and size corresponding to the results of said comparison calculation.

4. The aid device of claim 1 wherein said waveform data consist of a plurality of waveform data belonging to a same group;

and

wherein said calculating means calculates values for each of said plurality of waveform data by using said specified combinations to thereby obtain calculation results and determines at least either of an effective characteristic quantity for said judgment and a parameter for calculating value of effective characteristic quantity based on the calculation results on each of said specified combinations for said plurality of data.

5. The aid device of claim 4 wherein said graph makes a display by varying one selected from the group consisting of density, color, height and size corresponding to the results of said comparison calculation.

6. A display method for an aid device for an inspection system, said inspection system serving to obtain waveform data from an inspection object, to calculate a value of a characteristic quantity that characterizes said inspection object and to thereby make a judgment whether said inspection object is normal or abnormal, said aid device serving to determine at least either of an effective characteristic quantity for said judgment and a parameter for calculating value of said effective characteristic quantity, said method comprising the steps of:

selecting one or more characteristic quantities and one or more parameters;

calculating a value by using specified combinations of the selected characteristic quantities and parameters to thereby obtain calculation results; and

displaying a graph based on each of said calculation results for said specified combinations, said graph having at least two axes, each of said two axes being formed by one selected from said selected characteristic quantities and parameters.

7. The method of claim 6 wherein said graph makes a display by varying one selected from the group consisting of density, color, height and size corresponding to the results of said comparison calculation.