Circuit health monitoring system and method

• US 20060038692A1
• Filed: 08/18/2004
• Published: 02/23/2006
• Est. Priority Date: 08/18/2004
• Status: Active Grant

• Current Assignee: Hamilton Sundstrand Corporation (Raytheon Technologies Corporation d/b/a RTX)
• Original Assignee: Hamilton Sundstrand Corporation (Raytheon Technologies Corporation d/b/a RTX)
• Inventors: Schnetker, Ted R.
• Granted Patent: US 7,538,684 B2
• Time in Patent Office: Days
• US Class Current: 340/635
• CPC Class Codes: G01R 31/343 in operation
• CPC Class Codes: G01R 31/40 Testing power supplies testing photovoltaic devices H02S50/10

Abstract

A system and method that provides early warning of a capacitor failure before it causes a functional failure by including a plurality of redundant capacitive elements arranged in parallel in a capacitor module. A monitor measures a value corresponding to the total capacitance of the module under a selected system operating condition to obtain a baseline value. During system operation, the monitor compares a measured value with the baseline. If any of the capacitive elements in the module fails in an open state or a shorted state, the measured value will differ respect to the baseline, but the remaining capacitive elements allow the system to continue to operate. The user can therefore replace the failed capacitor as part of scheduled maintenance, reducing maintenance and operating costs caused by unexpected, unscheduled maintenance.

Claims

1. A system comprising:

at least two capacitive elements connected in parallel;

at least two current control devices coupled to said at least two capacitive elements; and

a monitor that compares a measured value corresponding to a total capacitance of said at least two capacitive elements with a baseline and indicates a failed capacitive element in the system if the measured value differs from the baseline.

2. The system of claim 1, wherein the monitor indicates the failed capacitive element if the measured value is below the baseline.

3. The system of claim 1, wherein the baseline is a fixed value corresponding to a desired total capacitance.

4. The system of claim 1, wherein the baseline is obtained by the monitor during a selected operating state of said at least two capacitive elements.

5. The system of claim 1, wherein at least one of said at least two capacitive elements continues operating the system when the other of said at least two capacitive elements fails.

6. The system of claim 1, wherein said at least two current control devices include any combination of at least one of an active device and a passive device.

7. The system of claim 1, wherein said at least two capacitive elements are disposed in a module.

8. The system of claim 7, wherein said at least two current control devices are disposed in the module.

9. An electric power distribution system, comprising:

a module comprising a plurality of capacitive elements connected in parallel;

a plurality of current control devices, each current control device associated with one of said plurality of capacitive elements to form an open circuit if current through one of said plurality of capacitive elements exceeds at least one of a selected level and a selected duration; and

a monitor that compares a measured value corresponding to a total capacitance of said plurality of capacitive elements with a baseline and indicates a failed capacitive element in the system if the measured value falls below the baseline.

10. The system of claim 9, wherein the baseline is a fixed value corresponding to a desired total capacitance.

11. The system of claim 9, wherein the baseline is obtained by the monitor during a selected operating state of said at least two capacitive elements.

12. The system of claim 9, wherein said plurality of current control devices include any combination of at least one of an active device and a passive device.

13. The system of claim 9, wherein said plurality of current control devices are disposed in the module.

14. A method of monitoring a circuit, comprising:

obtaining a baseline corresponding to a desired total capacitance of a module having a plurality of capacitive elements connected in parallel;

comparing a measured value with the baseline; and

indicating a failed capacitive element in the circuit if the measured value differs from the baseline.

15. The method of claim 14, wherein the obtaining step comprises selecting a fixed value corresponding to the desired total capacitance.

16. The method of claim 14, wherein at least one of the obtaining step and the comparing step is conducted during a selected operating state of the module.

17. The method of claim 16, wherein the selected operating state is at least one selected from the group of initial system construction, system installation, normal system operation, scheduled maintenance testing, a test procedure with external equipment, and a self-test procedure.

18. The method of claim 14, further comprising interrupting current flow through one of said plurality of capacitive elements when said one failed capacitive element fails, and continuing operation through another of said plurality of capacitive elements.