Systems and methods for measuring color and contrast in specular reflective devices
First Claim
Patent Images
1. A method of measuring color or contrast of a specular reflective device, comprising:
- providing incident illumination on the device that is substantially perpendicular to a reflective surface of the device; and
measuring a spectrum of only light reflected from the reflective surface that is substantially perpendicular to the reflective surface.
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Accused Products
Abstract
Disclosed herein are systems and methods for measuring color and contrast in specular reflective devices such as interferometric modulators. To make color and contrast determinations, light reflected from a specular reflective device may be measured in-line with illumination of the device. The measurements may include measuring the spectra of light reflected from the device being tested as well as from specular bright and dark standards. The spectra may be used to determine a reflectance spectrum and color parameters for the specular reflective device.
119 Citations
58 Claims
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1. A method of measuring color or contrast of a specular reflective device, comprising:
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providing incident illumination on the device that is substantially perpendicular to a reflective surface of the device; and
measuring a spectrum of only light reflected from the reflective surface that is substantially perpendicular to the reflective surface. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of measuring color or contrast of one or more sample interferometric modulators, comprising:
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measuring a spectrum of light reflected from a bright standard;
measuring a spectrum of light reflected from the one or more sample interferometric modulators; and
determining a reflectance spectrum of the sample interferometric modulators based on the spectra of light reflected from the bright standard and one or more sample interferometric modulators. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. An integrated reflective display element and test standard wafer, comprising:
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a plurality of reflective display elements adapted for use in a display; and
a bright standard, wherein the reflective display elements and the bright standard are present on a single wafer. - View Dependent Claims (23, 24, 25, 26)
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27. A wafer, comprising:
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a plurality of first means for reflecting light for use in a display; and
second means for reflecting light at an intensity greater than light reflected from the first means, wherein the first means and the second means are present on a single wafer. - View Dependent Claims (28, 29)
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30. An in-line lighting and measurement system, comprising:
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an illumination source adapted to illuminate a specularly reflective device;
a detector adapted to detect light reflected from the specularly reflective device; and
a specularly reflective bright standard adapted to specularly reflect light from the illumination source into the detector, thereby providing a reflectance spectrum standard for use in determining a reflectance spectrum of the specularly reflective device. - View Dependent Claims (31, 32, 33)
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34. An in-line lighting and measurement system, comprising:
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at least one detection fiber optic element adapted to receive input light from one end and operatively coupled to a detector on another end; and
a plurality of illumination fiber optic elements positioned peripherally around the at least one detection fiber optic element, the illumination fiber optic elements adapted to emit light from one end and operatively coupled to a light source at another end. - View Dependent Claims (35, 36, 37)
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38. A method of determining whether an array of interferometric modulators are suitable for use in a display, comprising:
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determining color parameters for at least some of the interferometric modulators in an un-driven state, a memory dark state, a memory bright state, and an over-driven state; and
identifying the array as suitable for use as a display based on said determining. - View Dependent Claims (39, 40, 41)
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42. An integrated interferometric modulator and test standard wafer manufactured by a process that comprises:
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a plurality of material deposition steps;
a plurality of patterning steps that define regions for material removal; and
a plurality of material removal steps, wherein the patterning steps are used to define a plurality of interferometric modulators and separately at least one reflectivity standard selected from the group consisting of a bright standard and a dark standard. - View Dependent Claims (43, 44)
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45. A method of manufacturing an interferometric modulator array, comprising:
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forming a plurality of interferometric modulators on a substantially transparent substrate;
forming a reflectivity standard on the substrate, wherein the reflectivity standard is selected from the group consisting of a bright standard and a dark standard. - View Dependent Claims (46)
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47. A method of measuring color of an interferometric modulator, comprising:
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detecting light reflected from the interferometric modulator, determining a first reference reflectivity using a means for reflecting a maximum amount of light; and
determining the color of the interferometric modulator from the detected light and first reference reflectivity. - View Dependent Claims (48, 49, 50, 54, 55, 56, 57, 58)
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51. An interferometric modulator display comprising a plurality of interferometric modulators identified as suitable for use in the display by:
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detecting light reflected from at least some of the interferometric modulators;
detecting light reflected from a bright standard; and
determining a reflectance spectrum, one or more color parameters, and/or a contrast ratio of the interferometric modulators. - View Dependent Claims (52, 53)
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Specification