Signal integrity self-test architecture

  • US 20070079188A1
  • Filed: 05/18/2004
  • Published: 04/05/2007
  • Est. Priority Date: 05/28/2003
  • Status: Active Grant
First Claim
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1. A method of testing an integrated circuit device comprising a module (47), which incorporates a module monitor (49) operable to produce a measurement signal indicative of an operating parameter of the module (47) concerned, the method including receiving a measurement signal from a module monitor (49) and processing that received signal to produce a test result.

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