Standardization methods for correcting spectral differences across multiple spectroscopic instruments
First Claim
1. A method of measuring a property of a sample with a spectroscopic system, the method comprising:
- measuring, with a first spectroscopic system, spectra of a first set of at least three different reference targets, each having a known, unique reflectivity spectrum;
calibrating the first spectroscopic system based on the spectra of the first set of reference targets measured by the first spectroscopic system;
measuring, with the first spectroscopic system, a spectrum of a known reference specimen having a known value of the property;
generating a model for the measured property on the first spectroscopic system using the spectrum of the known reference specimen;
measuring, with a second spectroscopic system, spectra of a second set of at least three different reference targets, each having a known, unique reflectivity spectrum;
calibrating the second spectroscopic system based on the spectra of the second set of reference targets measured by the second spectroscopic system;
applying the model to the second spectroscopic system;
measuring a spectrum of the sample using the second spectroscopic system; and
determining a value of the property using the model.
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Abstract
The invention relates to systems and methods for measuring properties of samples with standardized spectroscopic systems. The methods can include (i) measuring, with a first spectroscopic system, spectra of at least three different reference targets; (ii) calibrating the first spectroscopic system; (iii) measuring, with the first spectroscopic system, a spectrum of a known reference specimen having a known value of the property; (iv) generating a model for the measured property using the spectrum of the known reference specimen; (v) measuring, with a second spectroscopic system, the spectra of at least three different reference targets; (vi) calibrating the second spectroscopic system; (vii) applying the model to the second spectroscopic system; (viii) measuring a spectrum of the sample using the second spectroscopic system; and (ix) determining a value of the property using the model.
50 Citations
45 Claims
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1. A method of measuring a property of a sample with a spectroscopic system, the method comprising:
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measuring, with a first spectroscopic system, spectra of a first set of at least three different reference targets, each having a known, unique reflectivity spectrum;
calibrating the first spectroscopic system based on the spectra of the first set of reference targets measured by the first spectroscopic system;
measuring, with the first spectroscopic system, a spectrum of a known reference specimen having a known value of the property;
generating a model for the measured property on the first spectroscopic system using the spectrum of the known reference specimen;
measuring, with a second spectroscopic system, spectra of a second set of at least three different reference targets, each having a known, unique reflectivity spectrum;
calibrating the second spectroscopic system based on the spectra of the second set of reference targets measured by the second spectroscopic system;
applying the model to the second spectroscopic system;
measuring a spectrum of the sample using the second spectroscopic system; and
determining a value of the property using the model. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27)
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28. A standardized spectroscopic system comprising:
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a light source;
a spectrograph;
a probe for receiving light from the light source that is reflected by a target;
a processor configured to calculate calibration constants from reflectivity spectra of at least three different reference targets obtained by shining light from the light source on the at least three different reference targets and recording the reflectivity spectra received by the probe and measured by the spectrograph; and
a memory for storing the calibration constants. - View Dependent Claims (29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39)
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40. A method of measuring a property of a sample, the method comprising:
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calibrating a spectroscopic system, wherein calibrating the spectroscopic system comprises;
measuring, using the spectroscopic system, spectra of at least three different reference targets, each having a known, unique reflectivity spectrum; and
calibrating the spectroscopic system based on the spectra of the at least three different targets, wherein the spectroscopic system comprises a model that correlates a measured spectrum of the sample to a property of the sample;
measuring a spectrum of the sample using the calibrated spectroscopic system; and
determining a value of the property using the model. - View Dependent Claims (41, 42, 43)
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44. A method of constructing a spectroscopic model for a property of a sample, the method comprising:
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measuring, using a spectroscopic system, spectra of at least three different reference targets, each having a known, unique reflectivity spectrum;
calibrating the spectroscopic system based on the spectra of the at least three different targets;
measuring, using the spectroscopic system, a spectrum of a known reference specimen having a known value of the property; and
generating a model for the measured property using the spectrum of the known reference specimen. - View Dependent Claims (45)
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Specification