System and method for determining dimensions of structures/systems for designing modifications to the structures/systems
First Claim
1. A method of determining the physical dimensions and con-figuration of a structure and/or system comprising:
- scanning a structure and/or system with an x-ray backscatter unit;
collecting data from x-ray photons scattered by the structure and/or system;
combining and reconstructing the collected data into a 2-D, 2-D panoramic and/or 3-D data set;
generating 3-D surfaces and structures representing hidden objects from the data set;
mapping the 3-D surfaces and structures of the hidden objects into a structure and/or system reference coordinate system;
combining the 3-D surfaces and structures mapped into the reference coordinate system with models to form a 3-D CAD model of the structure and/or system; and
designing modifications to the structure and/or system using the 3-D CAD model.
1 Assignment
0 Petitions
Accused Products
Abstract
A method and system of determining the physical dimensions and configuration of a structure and/or system as a precursor to the design of modifications of the structure and/or system by analyzing hidden objects within the structure and/or system is provided. The method includes accessing the structure and/or system prior to the modification for preparation of the modification; scanning the structure and/or system with an x-ray backscatter unit; collecting data from the x-ray backscatter unit and combining and reconstructing the data into a 2-D, 2-D panoramic and/or 3-D data set; producing surfaces and structures of the hidden objects from the data set; and tying the surfaces and structures of the hidden objects into a pre-existing coordinate system of the structure and/or system creating a 3-D model.
90 Citations
22 Claims
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1. A method of determining the physical dimensions and con-figuration of a structure and/or system comprising:
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scanning a structure and/or system with an x-ray backscatter unit;
collecting data from x-ray photons scattered by the structure and/or system;
combining and reconstructing the collected data into a 2-D, 2-D panoramic and/or 3-D data set;
generating 3-D surfaces and structures representing hidden objects from the data set;
mapping the 3-D surfaces and structures of the hidden objects into a structure and/or system reference coordinate system;
combining the 3-D surfaces and structures mapped into the reference coordinate system with models to form a 3-D CAD model of the structure and/or system; and
designing modifications to the structure and/or system using the 3-D CAD model. - View Dependent Claims (2, 3, 4, 5, 6, 8, 9, 10, 11, 12, 13, 14, 15)
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7. (canceled)
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16. An inspection system for analyzing hidden objects within a structure and/or system for a modification, comprising:
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an X-ray backscatter system for collecting data about hidden objects; and
a computing system for combining and reconstructing the data into a 2-D, 2-D panoramic and/or 3-D data set, generating 3-D surfaces and structures from the data set, mapping the 3-D surfaces and structures of the hidden objects into a structure and/or system reference coordinate system, combining the 3-D surfaces and structures tied into the reference coordinate system with models to form a 3-D CAD model of the structure and/or system and designing modifications to the structure and/or system using the 3-D CAD model. - View Dependent Claims (17, 18, 19, 20, 21, 22)
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Specification