Peripheral inspection system and method

• US 20080013820A1
• Filed: 07/11/2006
• Published: 01/17/2008
• Est. Priority Date: 07/11/2006
• Status: Abandoned Application

• Current Assignee: Microview Technologies Pte., Ltd.
• Original Assignee: Microview Technologies Pte., Ltd.
• Inventors: Wei, Wong Soon, Smorgon, Sergey, Vertoprakhov, Victor
• Application Number:
  US11/484,282
• Publication Number:
  US 20080013820A1
• Time in Patent Office: Days
• US Class Current: 382/141
• CPC Class Codes: G01N 21/8803 Visual inspection measuring projectors G01B9/08
• CPC Class Codes: G01N 21/8806 Specially adapted optical and illumination features
• CPC Class Codes: G01N 21/952 Inspecting the exterior surface of cylindrical bodies or wires G01N21/956 takes precedence
• CPC Class Codes: G06T 2207/30108 Industrial image inspection
• CPC Class Codes: G06T 2207/30164 Workpiece; Machine component
• CPC Class Codes: G06T 3/073 Transforming surfaces of revolution to planar images, e.g. cylindrical surfaces to planar images
• CPC Class Codes: G06T 5/006 Geometric correction correction of chromatic aberrations adapted to be used in an image pickup device containing an electronic image sensor H04N23/10; detecting, correcting, reducing or removing artefacts resulting only from the lens unit, e.g. flare, shading, vignetting or "cos4" H04N25/61
• CPC Class Codes: G06T 5/80 Geometric correction
• CPC Class Codes: G06T 7/0004 Industrial image inspection

Abstract

A method of inspecting two or more sides of an object is provided. The method includes generating one set of image data of two or more sides of the object, such as by using spherical mirror segments that project all sides of the object onto a single image and generating an X by Y array of image data of the single image. The projection of the image data is then compensated for, such as by identifying inspection processes to locate defects of the object in the projected image data or by converting the image data from the projected inspection coordinates to Cartesian coordinates. Predetermined inspection processes are then performed on the compensated image data, such as by using the inspection processes that are optimised for use with the projected image data or by converting the projected image data into a Cartesian format and using Cartesian image data inspection processes.

Claims

1. A method of inspecting two or more sides of an object comprising:

generating one set of image data of two or more sides of the object;

compensating for projection of the image data; and

performing predetermined inspection processes on the compensated image data.

2. The method of claim 1 wherein generating one set of image data of two or more sides of the object comprises:

placing the object under a first spherical segment mirror; and

receiving image data from the first spherical segment mirror a circumferential spherical segment mirror that encircles the object.

3. The method of claim 1 wherein compensating for projection of the image data comprises converting the image data from an inspection coordinate format into a Cartesian coordinate format.

4. The method of claim 1 wherein performing predetermined inspection processes on the compensated image data comprises using inspection processes that are optimised for data generated in the inspection coordinate format.

5. A system for inspecting two or more sides of an object comprising:

two or more mirrors and one or more lenses generating an image of the two or more sides of the object;

an image data generation system generating image data of the image of the two or more sides of the object; and

a projected image data inspection system compensating for projection of the image of the two or more sides of the object and analysing the compensated image data to determine whether the object contains defects.

6. The system of claim 5 wherein the two or more mirrors comprise:

a first spherical mirror segment located between the object and the image data generation system; and

one or more lenses located between a second spherical mirror and the image data generation system.

7. The system of claim 5 wherein the two or more mirrors comprise:

a conical mirror segment located between the object and the lens; and

a spherical mirror segment encircling the conical mirror segment and the object.

8. The system of claim 5 wherein the projected image data inspection system comprises a polar inspection system receiving projected polar image data of the object and performing one or more inspection processes on the projected polar image data.

9. The system of claim 5 wherein the projected image data inspection system comprises a Cartesian mapping and inspection system receiving projected polar image data of the object, converting the projected polar image data into Cartesian coordinate data, and performing one or more inspection processes on the Cartesian coordinate data.

10. The system of claim 5 wherein the projected image data inspection system comprises a peripheral location system receiving projected polar image data of the object and identifying a predetermined feature on the periphery of the object.

11. The system of claim 5 wherein the two or more mirrors comprise:

a first mirror segment located between the object and the image data generation system;

a second mirror segment encircling the first mirror segment and the object; and

a lens located between the object and the image data generation system.

12. The system of claim 6 wherein the first spherical mirror segment has a hole through which the object is inspected.

13. The system of claim 7 wherein the conical mirror segment has a hole through which the object is inspected.