Device and Method for Inspecting for Flaw on Surface of Work
First Claim
1. A flaw inspection device which inspects for presence of a flaw on a surface of a workpiece, comprising:
- a surface position measurement means which, while rotating said workpiece around a predetermined rotational axis, measures a surface position of an inspection region of said workpiece in a direction perpendicular to said rotational axis, for each of rotational angles;
a surface waveform acquisition means which receives an output signal of said surface position measurement means, and acquires surface waveform data which specifies said surface position with respect to each of the rotational angles;
a high frequency waveform extraction means which extracts, from said surface waveform data, high frequency waveform data which has a frequency higher than a predetermined frequency, or high frequency waveform data which specifies a change of a position within an angular range smaller than a predetermined angle; and
a flaw decision means which decides upon the presence of the flaw at said inspection region, based upon said high frequency waveform data which has been extracted.
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Accused Products
Abstract
A device for inspecting for minute flaws upon the outer surface of journal or pin portions of a crank shaft comprises a main device 12 and a control device 14. The main device 12 brings a gauge head 56, which can freely move forwards and backwards along a Y axis direction, into contact with an inspection region 16A of the the crank shaft 16 while rotating the crank shaft 16 around a rotational axis 16C, measures the surface position of the inspection region 16A for each of rotational angles, and obtains surface portion waveform data corresponding to rotational angle. The gauge head 56 has an oscillation function, and always contacts against the inspection region 16A during rotation. The control device 14 extracts high frequency waveform components from the obtained waveform data, and detects flaws on the inspection region based on the high frequency waveform components.
19 Citations
11 Claims
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1. A flaw inspection device which inspects for presence of a flaw on a surface of a workpiece, comprising:
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a surface position measurement means which, while rotating said workpiece around a predetermined rotational axis, measures a surface position of an inspection region of said workpiece in a direction perpendicular to said rotational axis, for each of rotational angles;
a surface waveform acquisition means which receives an output signal of said surface position measurement means, and acquires surface waveform data which specifies said surface position with respect to each of the rotational angles;
a high frequency waveform extraction means which extracts, from said surface waveform data, high frequency waveform data which has a frequency higher than a predetermined frequency, or high frequency waveform data which specifies a change of a position within an angular range smaller than a predetermined angle; and
a flaw decision means which decides upon the presence of the flaw at said inspection region, based upon said high frequency waveform data which has been extracted. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A flaw inspection device which inspects for presence of a flaw on a surface of a workpiece, comprising:
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a surface position measurement device which, while rotating said workpiece around a predetermined rotational axis, measures a surface position of an inspection region of said workpiece in a direction perpendicular to said rotational axis, for each of the rotational angles; and
a control device which is connected to said surface position measurement device;
wherein said control device;
receives an output signal of said surface position measurement means;
acquires surface waveform data which specifies said surface position with respect to each of rotational angles;
extracts, from said surface waveform data which has been acquired, high frequency waveform data which has a frequency higher than a predetermined frequency, or high frequency waveform data which specifies a change of a position within an angular range smaller than a predetermined angle; and
decides upon the presence or absence of a flaw at said inspection region, based upon said high frequency waveform data which has been extracted.
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11. A flaw inspection method which inspects for presence of a flaw on a surface of a workpiece, comprising:
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a step of measuring a surface position of an inspection region of said workpiece in a direction perpendicular to a predetermined rotational axis, for each of rotational angles around said rotational axis;
a step of acquiring, from said surface position for each of the rotational angles which has been measured, surface waveform data which specifies a waveform of said surface position with respect to each of the rotational angles;
a step of extracting, from said surface waveform data, high frequency waveform data which has a frequency higher than a predetermined frequency, or high frequency waveform data which specifies a change of a position within an angular range smaller than a predetermined angle; and
a step of deciding upon the presence of a flaw at said inspection region, based upon said high frequency waveform data which has been extracted.
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Specification