Method for low temperature bonding and bonded structure
First Claim
1. A bonding method, comprising:
- forming first and second bonding surfaces on first and second materials, respectively, at least one of said surfaces comprising an insulating material;
enhancing activation of one of said first and second bonding surfaces;
terminating said first and second bonding surfaces with a species allowing formation of chemical bonds;
annealing said first and second materials at a temperature of no more than about 200°
C.; and
forming a chemical bond between said first and second materials.
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Accused Products
Abstract
A method for bonding at low or room temperature includes steps of surface cleaning and activation by cleaning or etching. One etching process The method may also include removing by-products of interface polymerization to prevent a reverse polymerization reaction to allow room temperature chemical bonding of materials such as silicon, silicon nitride and SiO2. The surfaces to be bonded are polished to a high degree of smoothness and planarity. VSE may use reactive ion etching or wet etching to slightly etch the surfaces being bonded. The surface roughness and planarity are not degraded and may be enhanced by the VSE process. The etched surfaces may be rinsed in solutions such as ammonium hydroxide or ammonium fluoride to promote the formation of desired bonding species on the surfaces.
2 Citations
31 Claims
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1. A bonding method, comprising:
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forming first and second bonding surfaces on first and second materials, respectively, at least one of said surfaces comprising an insulating material;
enhancing activation of one of said first and second bonding surfaces;
terminating said first and second bonding surfaces with a species allowing formation of chemical bonds;
annealing said first and second materials at a temperature of no more than about 200°
C.; and
forming a chemical bond between said first and second materials. - View Dependent Claims (2, 3, 4, 5, 6, 7, 23, 24)
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8. A processing method, comprising:
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exposing a first surface of a first element to a plasma to at least enhance activation of said first surface;
terminating said first surface with a species capable of forming a chemical bond after exposure to said plasma; and
bonding said first surface to a second surface of a second element after said terminating step;
heating said first and second elements to a temperature no more than about 200°
C.; and
obtaining a bond strength of at least 500 mJ/m2. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A bonding method, comprising:
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forming a silicon oxide material on a first element;
enhancing activation of a surface of said silicon oxide material using a plasma RIE process;
exposing said silicon oxide material to an ammonia-based solution after said enhancing;
bringing together said silicon oxide material and a second element, after said enhancing and exposing steps; and
forming a chemical bond between said silicon oxide material and said second element. - View Dependent Claims (16, 17, 18, 19, 20, 21, 22)
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25. A bonded structure, comprising:
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first and second materials having first and second bonding surfaces, respectively, at least one of said surfaces comprising an insulating material and at least one of said surfaces having enhanced surface activation;
said first and second bonding surfaces terminated with a species allowing formation of chemical bonds; and
a chemical bond formed between said first and second materials after annealing said first and second materials at a temperature of no more than about 200°
C. - View Dependent Claims (26, 27, 28, 29, 30, 31)
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Specification