METHOD AND APPARATUS FOR DETECTING EMBEDDED MATERIAL WITHIN AN INTERACTION REGION OF A STRUCTURE
First Claim
1. An optical system for detecting embedded material in a structure, the optical system comprising:
- a lens positioned to receive light emitted from an interaction region of the structure during irradiation of the interaction region with laser light;
an optical fiber optically coupled to the lens; and
an analyzer optically coupled to the optical fiber, the analyzer responsive to light indicative of the embedded material within the interaction region.
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Abstract
A system and method processes a structure comprising embedded material. The system includes a laser adapted to generate light and to irradiate an interaction region of the structure. The system further includes an optical system adapted to receive light from the interaction region and to generate a detection signal indicative of the presence of embedded material in the interaction region. The system further includes a controller operatively coupled to the laser and the optical system. The controller is adapted to receive the detection signal and to be responsive to the detection signal by selectively adjusting the laser.
89 Citations
24 Claims
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1. An optical system for detecting embedded material in a structure, the optical system comprising:
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a lens positioned to receive light emitted from an interaction region of the structure during irradiation of the interaction region with laser light;
an optical fiber optically coupled to the lens; and
an analyzer optically coupled to the optical fiber, the analyzer responsive to light indicative of the embedded material within the interaction region. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method of avoiding substantially damaging embedded material within a laser-irradiated interaction region of a structure comprising the embedded material, the method comprising:
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processing the structure by irradiating the interaction region with laser light;
collecting light from the interaction region;
analyzing at least a portion of the collected light for indications of the embedded material within the interaction region; and
selectively adjusting the processing of the structure in response to the indications. - View Dependent Claims (11, 12, 13, 14, 15, 17, 18)
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16. A laser system for processing a structure comprising embedded material, the laser system comprising:
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a laser adapted to generate light and to irradiate an interaction region of the structure;
an optical system adapted to receive light from the interaction region and to generate a detection signal indicative of the presence of embedded material in the interaction region; and
a controller operatively coupled to the laser and the optical system, the controller adapted to receive the detection signal, the controller responsive to the detection signal by selectively adjusting the laser.
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19. A processing system for removing material from a structure comprising embedded material, the processing system comprising:
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a source of energy waves adapted to impinge an interaction region of the structure with the energy waves;
an analyzer adapted to receive light from the interaction region and to generate a detection signal indicative of the presence of the embedded material in the interaction region; and
a controller operatively coupled to the source and the analyzer, the controller adapted to receive the detection signal, the controller responsive to the detection signal by selectively adjusting the source. - View Dependent Claims (20, 21)
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22. A method of processing a structure comprising embedded material, the method comprising:
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irradiating an interaction region of the structure with laser light;
collecting light from the interaction region;
analyzing at least a portion of the collected light for indications of the embedded material within the interaction region; and
selectively adjusting the processing of the structure in response to the indications. - View Dependent Claims (23, 24)
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Specification