FPGA AND METHOD AND SYSTEM FOR CONFIGURING AND DEBUGGING A FPGA
First Claim
1. A Field Programmable Gate Array including a logic unit under test, the Field Programmable Gate Array comprising:
- a probe signal selecting unit configured to select at least one probe point from a plurality of probe points in said logic unit under test and obtain a probe signal at said probe point; and
a high speed serial transceiver configured to convert said probe signal into a high speed serial signal and transmit said high speed serial signal to outside the Field Programmable Gate Array.
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Abstract
The present invention provides a Field Programmable Gate Array (FPGA), a system for debugging a Field Programmable Gate Array, a method for debugging a Field Programmable Gate Array, a FPGA configuration data product and a method and system for configuring a FPGA. According to one aspect of the invention, there is provided a Field Programmable Gate Array (FPGA) having a logic unit under test and comprising: a probe signal selecting unit configured to select at least one probe point from a plurality of probe points in said logic unit under test, and obtain a probe signal at said probe point; and a high speed serial transceiver configured to convert said probe signal into a high speed serial signal and transmit it to outside.
22 Citations
16 Claims
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1. A Field Programmable Gate Array including a logic unit under test, the Field Programmable Gate Array comprising:
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a probe signal selecting unit configured to select at least one probe point from a plurality of probe points in said logic unit under test and obtain a probe signal at said probe point; and a high speed serial transceiver configured to convert said probe signal into a high speed serial signal and transmit said high speed serial signal to outside the Field Programmable Gate Array. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A system for debugging Field Programmable Gate Arrays, the system comprising:
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a Field Programmable Gate Array including; a) a probe signal selecting unit configured to select at least one probe point from a plurality of probe points in said logic unit under test and obtain a probe signal at said probe point; and b) a high speed serial transceiver configured to convert said probe signal into a high speed serial signal and transmit said high speed serial signal to outside the Field Programmable Gate Array; and an analyzing means configured to receive and analyze a signal sent by said high speed serial transceiver. - View Dependent Claims (9)
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10. A method for debugging a Field Programmable Gate Array having a logic unit under test, the method comprising:
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probing a probe signal of at least one probe point in said logic unit under test; converting said probe signal into a high speed serial signal and sending it to an external analyzing means; and analyzing said signal. - View Dependent Claims (11, 12)
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13. A computer program embodied in computer readable memory, the computer program comprising:
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a probe signal selecting module configured to select at least one probe point from a plurality of probe points in a logic unit under test of a Field Programmable Gate Array, and obtain a probe signal at said probe point; and a configuration module for enabling a high speed serial transceiver to convert said probe signal into a high speed serial signal and transmit it to outside the Field Programmable Gate Array. - View Dependent Claims (14)
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15. A system for configuring a Field Programmable Gate Array, comprising loading configuration data into means in the Field Programmable Gate Array to enable the Field Programmable Gate Array to have following functional modules:
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a probe signal selecting unit configured to select at least one probe point from a plurality of probe points in a logic unit under test of said Field Programmable Gate Array, and obtain a probe signal at said probe point; and a high speed serial transceiver configured to convert said probe signal into a high speed serial signal and transmit it to outside. - View Dependent Claims (16)
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Specification