Apparatus For Depth-Selective Raman Spectroscopy

  • US 20080129992A1
  • Filed: 11/25/2005
  • Published: 06/05/2008
  • Est. Priority Date: 12/09/2004
  • Status: Active Grant
First Claim
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1. A method of measuring sub-surface Raman scattering through a diffusely scattering sample, the method comprising steps of:

  • (a) supplying incident radiation at an entry region on a surface of the sample;

    (b) collecting light scattered within the sample, from a collection region on the surface, the collection region being spaced from the entry region; and

    (c) detecting, in the collected light, one or more Raman features spectrally related to the incident radiation.

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