AMPERAGE/VOLTAGE LOOP CALIBRATOR WITH LOOP DIAGNOSTICS

• US 20080136422A1
• Filed: 07/23/2007
• Published: 06/12/2008
• Est. Priority Date: 10/17/2003
• Status: Active Grant

• Current Assignee: Clartek LLC
• Original Assignee: Ronald P. Clarridge
• Inventors: Clarridge, Ronald P., Allen, Gerald T.
• Granted Patent: US 9,244,111 B2
• Time in Patent Office: Days
• US Class Current: 324/601
• CPC Class Codes: G01R 15/125 for digital multimeters
• CPC Class Codes: G01R 31/52 Testing for short-circuits, leakage current or ground faults
• CPC Class Codes: G01R 31/54 Testing for continuity
• CPC Class Codes: G01R 35/005 Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references G01R33/0035, G01R35/002 take precedence

Abstract

A testing device for determines values of various electrical variables associated with a device within a process system. The testing device provides bidirectional electrical communication with a device to be monitored and automatically provides a connection configuration between a processing unit and a set of input/output ports. The connection configuration governs a bidirectional flow of electrical signals between the processing unit and the device to be monitored. The processing unit outputs a test signal and a configuration control signal to the input/output port control circuitry. The input/output port control circuitry, in response to received test and configuration control signals, automatically provides a connection configuration to direct the test signal to the device to be monitored and to direct a return signal, the return signal being generated by the monitored device in response to the test signal, to the processing unit. The processing unit, based upon the connection configuration of the input/output port control circuitry, measures an electrical characteristic of the return signal and determines at least two electrical variables associated with the monitored device based upon the measured electrical characteristic of the return signal generated by the monitored device.

Claims

1. A testing device for providing diagnostics of a device, comprising:

a processing unit;

a plurality of ports to provide an electrical communication interface between said processing unit and the device;

a set of wires, each wire being connectable with a port; and

port control circuitry, operatively connected to said plurality of ports and said processing unit, to automatically provide a connection configuration between said processing unit and said plurality of ports;

said processing unit outputting a test signal and a configuration control signal to said port control circuitry;

said port control circuitry, in response to received test signal and received configuration control signal, automatically configuring a connection configuration to provide a test path for the test signal with respect to a port and to provide a return path to enable said processing unit to measure a return signal present at a port;

said processing unit measuring the return signal;

said processing unit, based upon the connection configuration of said port control circuitry and the measured return signal, determining which wires of said set of wires are functionally connected to a port.

2. The testing device as claimed in claim 1, wherein said processing unit determines an electrical current value and a voltage value for the device based upon the measured return signal.

3. The testing device as claimed in claim 1, wherein said processing unit determines an electrical current value, an impedance value, and a voltage value for the device based upon the measured return signal.

4. A testing device for providing diagnostics of a device, comprising:

a processing unit;

a plurality of ports to provide an electrical communication interface between said processing unit and the device;

a set of wires being connected between said plurality of ports and an interface for the device; and

port control circuitry, operatively connected to said plurality of ports and said processing unit, to automatically provide a connection configuration between said processing unit and said plurality of ports;

said processing unit outputting a test signal and a configuration control signal to said port control circuitry;

said port control circuitry, in response to received test signal and received configuration control signal, automatically configuring a connection configuration to provide a test path for the test signal with respect to a port and to provide a return path to enable said processing unit to measure a return signal present at a port;

said processing unit measuring the return signal;

said processing unit, based upon the connection configuration of said port control circuitry and the measured return signal, determining if the connection of the wires to said plurality of ports is consistent with an installation of the device.

5. The testing device as claimed in claim 4, wherein said processing unit determines an electrical current value and a voltage value for the device based upon the measured return signal.

6. The testing device as claimed in claim 4, wherein said processing unit determines an electrical current value, an impedance value, and a voltage value for the device based upon the measured return signal.

7. A testing device for providing diagnostics of a device, comprising:

a processing unit;

a plurality of ports to provide an electrical communication interface between said processing unit and the device;

a set of wires being connected between said plurality of ports and an interface for the device; and

port control circuitry, operatively connected to said plurality of ports and said processing unit, to automatically provide a connection configuration between said processing unit and said plurality of ports;

said processing unit outputting a test signal and a configuration control signal to said port control circuitry;

said port control circuitry, in response to received test signal and received configuration control signal, automatically configuring a connection configuration to provide a test path for the test signal with respect to a port and to provide a return path to enable said processing unit to measure a return signal present at a port;

said processing unit measuring the return signal;

said processing unit, based upon the connection configuration of said port control circuitry and the measured return signal, determining if the connection of the wires to the interface of the device is correct.

8. The testing device as claimed in claim 7, wherein said processing unit determines an electrical current value and a voltage value for the device based upon the measured return signal.

9. The testing device as claimed in claim 7, wherein said processing unit determines an electrical current value, an impedance value, and a voltage value for the device based upon the measured return signal.

10. A testing device for providing diagnostics of a device, comprising:

a processing unit;

a plurality of ports to provide an electrical communication interface between said processing unit and the device;

a set of wires being connected between said plurality of ports and an interface for the device; and

port control circuitry, operatively connected to said plurality of ports and said processing unit, to automatically provide a connection configuration between said processing unit and said plurality of ports;

said processing unit outputting a test signal and a configuration control signal to said port control circuitry;

said port control circuitry, in response to received test signal and received configuration control signal, automatically configuring a connection configuration to provide a test path for the test signal with respect to a port and to provide a return path to enable said processing unit to measure a return signal present at a port;

said processing unit measuring the return signal;

said processing unit, based upon the connection configuration of said port control circuitry and the measured return signal, determining if the connection of the wires to said plurality of ports is correct.

11. The testing device as claimed in claim 10, wherein said processing unit, based upon the connection configuration of said port control circuitry and the measured return signal, determines if the connection of the wires to the interface of the device is correct.

12. The testing device as claimed in claim 10, wherein said processing unit determines an electrical current value and a voltage value for the device based upon the measured return signal.

13. The testing device as claimed in claim 10, wherein said processing unit determines an electrical current value, an impedance value, and a voltage value for the device based upon the measured return signal.

14. The testing device as claimed in claim 11, wherein said processing unit determines an electrical current value and a voltage value for the device based upon the measured return signal.

15. The testing device as claimed in claim 11, wherein said processing unit determines an electrical current value, an impedance value, and a voltage value for the device based upon the measured return signal.