METHODS AND APPARATUS FOR DETERMINING PARTICLE CHARACTERISTICS BY MEASURING SCATTERED LIGHT

• US 20080218738A1
• Filed: 10/31/2007
• Published: 09/11/2008
• Est. Priority Date: 04/10/2004
• Status: Abandoned Application

• Current Assignee: Michael Trainer
• Original Assignee: Michael Trainer
• Inventors: Trainer, Michael
• Application Number:
  US11/930,588
• Publication Number:
  US 20080218738A1
• Time in Patent Office: Days
• US Class Current: 356/72
• CPC Class Codes: G01B 11/08 for measuring diameters
• CPC Class Codes: G01N 15/0211 Investigating a scatter or diffraction pattern
• CPC Class Codes: G01N 15/042 by centrifuging and investigating centrifugates centrifuges per se B04B
• CPC Class Codes: G01N 2015/0216 from fluctuations of diffraction pattern
• CPC Class Codes: G02B 6/32 having lens focusing means positioned between opposed fibre ends with lens being an integral part of the single fibre end G02B6/262

Abstract

An instrument for measuring the size and characteristics of a particle contained in a sample of particles. A particle sample is introduced into a sample chamber. The sample particles are subjected to centrifugal forces so that large particles travel in the sample chamber at velocities greater than small particles. Light is shown upon the particles as they travel in the sample chamber. The particles diffract the light. The diffracted light is then received by detectors that convert the diffracted light into corresponding electronic signals. The electronic signals are analyzed to determine the size and characteristics of the particles that caused the diffracted light.

Claims

1. An apparatus for measuring characteristics of particles in a dispersion, as determined from scattered light and particle motion in a fluid, comprising:

a) a sample cell which contains the particle dispersion and which provides optical access for passage of light,

b) an acceleration means for producing forces on particles, and

c) means for measuring effects of particle motion, caused by said forces, so as to determine accurately a characteristic of said particles.

2. The apparatus of claim 1, wherein said acceleration means comprises means for accelerating the particles by gravity.

3. The apparatus of claim 1, wherein said acceleration means comprises means for generating centrifugal acceleration.

4. The apparatus of claim 1, further comprising an optical system which measures scattered light from a small volume of dispersant, and a surface which is above said small volume, wherein the surface prevents particles from settling through said surface and said small volume.

5. The apparatus of claim 1, wherein said measuring means comprises:

a) an optical system comprising a light source and means for directing light from said light source towards said particle dispersion,

b) a detection means for collecting and measuring scattered light from said particle dispersion,

c) a beam splitting means for mixing light from said light source with said scattered light on at least one detector in said detection means to measure optical frequency shifts of said scattered light due to said particle motion,

d) means for calculating a power spectrum of a scattered signal which includes said optical frequency shifts from at least one particle, and

e) means for calculating a particle characteristic from said power spectrum.

6. The apparatus of claim 1, wherein said measuring means comprises:

a) an optical system comprising a light source and means for directing light from said light source towards said particle dispersion,

b) a detection means for collecting and measuring scattered light from said particle dispersion,

c) a periodic spatial mask, positioned at a location which is conjugate to the particles, for creating modulation frequencies of the scatter signal due to particle motion,

d) means for calculating a power spectrum of a scattered signal which includes said modulation frequencies of the scatter signal from at least one particle, and

e) means for calculating a particle characteristic from said power spectrum.

7. The apparatus of claim 1, wherein said measuring means comprises:

a) an optical system comprising a light source and means for directing light from said light source towards said particle dispersion,

b) a detection means for collecting and measuring scattered light from said particle dispersion, and

c) a mechanical system which causes motion between said optical system and detection means, and said particles along the direction of particle motion, for measuring scattered light characteristics from particles at various locations along said direction.

8. The apparatus of claim 7, further comprising means for measuring said scattered light characteristics as a function of time at each location, and for determining a particle characteristic from said scattered light characteristics, which are measured as a function of time.

9. The apparatus of claim 7, further comprising means for measuring said scattered light characteristics as a function of scattering angle at each location, and for determining a particle characteristic from said scattered light characteristics, which are measured as a function of scattering angle.

10. The apparatus of claim 1, further comprising a centrifuge within which said particles move, wherein the sample cell and the measuring means are attached to, and move with, the centrifuge.

11. The apparatus of claim 1, further comprising a centrifuge within which said particles move, wherein the sample cell is attached to, and moves with, the centrifuge, and wherein the measuring means is stationary with respect to the centrifuge.

12. A method for determining particle characteristics from a set of measurements of scattered light characteristics, each measurement being performed under a different condition, the method comprising the steps of:

a) directing light from a light source towards a particle dispersion,

b) detecting and measuring light scattered from said particle dispersion, and

c) causing motion between said light source and a detection means, and particles along a direction of particle motion,

wherein step (b) is performed a plurality of times, each time for a different condition of particles in said dispersion.

13. The method of claim 12, further comprising:

d) measuring a group of scatter characteristics for each of various conditions of particles in said dispersion,

e) calculating a difference between groups of scatter characteristics with different conditions to produce a set of differential scatter characteristics,

f) calculating a particle characteristic distribution from each member of said set of differential scatter characteristics, to produce an individual particle characteristic distribution for each member of said set of differential scatter characteristics, and

g) combining said individual particle characteristic distributions into one particle characteristic distribution.

14. The method of claim 12, further comprising:

d) measuring a group of scatter characteristics for each of various conditions of particles in said dispersion,

e) calculating a particle characteristic distribution from each member of said set of groups of scatter characteristics, to produce an individual particle characteristic distribution for each member of said set of groups of scatter characteristics, and

f) combining said individual particle characteristic distributions into one particle characteristic distribution.

15. The method of claim 12, wherein said condition is selected to be location of a particle along a path of motion.

16. The method of claim 12, wherein said condition is selected to be a time during which a particle is accelerated along a path of motion.

17. The method of claim 15, wherein said different locations are selected to be adjacent locations.

18. The method of claim 12, wherein said different condition is chosen based upon change in scatter characteristics between chosen conditions.

19. The method of claim 14, further comprising concentrating particles in a region at one end of a sample cell using a particle support mesh.

20. A method for determining a distribution of particle characteristics from a power spectrum of a scatter signal, comprising:

a) directing light onto a plurality of moving particles, and detecting light scattered from said particles,

b) measuring a power spectrum of a scattering signal for various values of acceleration and/or scattering angle of said particles,

c) creating a set of simultaneous equations which relate said measured power spectra, which are functions of frequency, scattering angle, and acceleration, to theoretical power spectra, which are functions of frequency, scattering angle, acceleration, and particle characteristics, and to a particle characteristic distribution, and

d) solving said simultaneous equations so as to express the particle characteristic distribution in terms of the measured and theoretical power spectra.