APPARATUS FOR CALIBRATING DISPLACEMENT OF REFLECTIVE PARTS IN DIFFRACTIVE OPTICAL MODULATOR

• US 20080218837A1
• Filed: 03/06/2008
• Published: 09/11/2008
• Est. Priority Date: 03/08/2007
• Status: Active Grant

• Current Assignee: Samsung Electro-Mechanics Co., Ltd. (Samsung Group)
• Original Assignee: Samsung Electro-Mechanics Co., Ltd. (Samsung Group)
• Inventors: Yang, Haeng Seok, Yun, Sang Kyeong, An, Seung Do
• Granted Patent: US 7,532,319 B2
• Time in Patent Office: Days
• US Class Current: 359/239
• CPC Class Codes: G02B 26/0808 by means of one or more diffracting elements

Abstract

Disclosed herein is an apparatus for calibrating the displacement of reflective parts in a diffractive optical modulator. The apparatus includes a diffractive optical modulator, a light intensity measurement unit, a projection unit, and display electronics. The light intensity measurement unit is disposed near one side of the diffractive optical modulator and measures and outputs the intensity of incident linear diffracted light having a predetermined diffraction order.

Claims

1. An apparatus for calibrating displacement of reflective parts in a diffractive optical modulator, comprising:

a diffractive optical modulator for, when test voltage is applied thereto, diffracting incident light based on the applied test voltage and emitting linear diffracted light having a plurality of diffraction orders;

a light intensity measurement unit disposed near one side of the diffractive optical modulator and configured to measure and output intensity of incident linear diffracted light having a predetermined diffraction order;

a projection unit for causing diffracted light having a first predetermined diffraction order, which belongs to the diffracted light having a plurality of diffraction orders, emitted from the diffractive optical modulator, to enter the light intensity measurement unit, and directing diffracted light having a second predetermined diffraction to a screen; and

display electronics for applying the test voltage to the diffractive optical modulator, calculating calibration voltage by comparing the intensity of light that is measured by the light intensity measurement unit with intensity of light that is expected to be measured for the diffracted light having a first predetermined diffraction order when the test voltage is applied to the diffractive optical modulator, and determining subsequent driving voltage based on the calibration voltage.

2. The apparatus for calibrating displacement of reflective parts as set forth in claim 1, wherein the light intensity measurement unit is a photodiode array that is configured such that each unit photodiode corresponds to a predetermined number of pixels of the diffractive optical modulator.

3. The apparatus for calibrating displacement of reflective parts as set forth in claim 1, wherein the projection unit comprises a filter that has reflective surfaces and thus reflects the diffracted light having a first predetermined diffraction order toward the light intensity measurement unit, and that passes the diffracted light having a second predetermined diffraction order, emitted from the diffractive optical modulator, therethrough.

4. The apparatus for calibrating displacement of reflective parts as set forth in claim 1, wherein the projection unit comprises:

a projection lens for magnifying the diffracted light emitted from the diffractive optical modulator;

a filter configured to have reflective surfaces and thus reflect the diffracted light having a first predetermined diffraction order toward the light intensity measurement unit, and to pass the diffracted light having a second predetermined diffraction order, emitted from the diffractive optical modulator, therethrough; and

a scanner for forming images by scanning the diffracted light having a second predetermined diffraction order, passed through the filter, across the screen.

5. The apparatus for calibrating displacement of reflective parts as set forth in claim 3, wherein the diffracted light having a first predetermined diffraction order, reflected from the filter, is ±

1st-order diffracted light, and the diffracted light having a second diffraction order is 0th-order diffracted light.

6. The apparatus for calibrating displacement of reflective parts as set forth in claim 2, wherein the photodiode array is disposed on one side of and parallel to the diffractive optical modulator.