Methods of Examining an Item of Luggage by Means of an X-Ray Diffraction Method
First Claim
1. Method of examining an item of luggage, in which an X-ray fluoroscopic image of the whole item of luggage is produced first, then planiform suspect regions in the X-ray fluoroscopic image are determined and the scanning time during the following production of an X-ray diffraction image depends on whether the X-ray beam is located specifically in a planiform suspect region, wherein the scanning time heads towards zero outside a planiform suspect region and lasts long enough inside a planiform suspect region to obtain an informative X-ray diffraction image.
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Abstract
The invention relates to a method of examining an item of luggage 1, in which an X-ray fluoroscopic image of the whole item of luggage 1 is produced first, then planiform suspect regions 4, 5, 6 in the X-ray fluoroscopic image are determined and the scanning time during the following production of an X-ray diffraction image depends on whether the X-ray beam is located specifically in a planiform suspect region 4, 5, 6, wherein the scanning time heads towards zero outside a planiform suspect region 4, 5, 6 and lasts long enough inside a planiform suspect region 4, 5, 6 to obtain an informative X-ray diffraction image
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14 Claims
- 1. Method of examining an item of luggage, in which an X-ray fluoroscopic image of the whole item of luggage is produced first, then planiform suspect regions in the X-ray fluoroscopic image are determined and the scanning time during the following production of an X-ray diffraction image depends on whether the X-ray beam is located specifically in a planiform suspect region, wherein the scanning time heads towards zero outside a planiform suspect region and lasts long enough inside a planiform suspect region to obtain an informative X-ray diffraction image.
Specification