METHODS AND SYSTEMS FOR DETECTING A CAPACITANCE USING SIGMA-DELTA MEASUREMENT TECHNIQUES

• US 20090039902A1
• Filed: 10/15/2008
• Published: 02/12/2009
• Est. Priority Date: 06/03/2005
• Status: Active Grant

• Current Assignee: Synaptics Incorporated
• Original Assignee: Synaptics Incorporated
• Inventors: ELY, David, HAINES, Julian, HARGREAVES, Kirk, REYNOLDS, Joseph Kurth
• Granted Patent: US 7,683,641 B2
• Time in Patent Office: Days
• US Class Current: 324/686
• CPC Class Codes: G01R 27/2605 Measuring capacitance capacitive sensors G01D5/24

Abstract

Methods, systems and devices are described for detecting a measurable capacitance using sigma-delta measurement techniques. According to various embodiments, a voltage is applied to the measurable capacitance using a first switch. The measurable capacitance is allowed to share charge with a passive network. If the charge on the passive network is past a threshold value, then the charge on the passive network is changed by a known amount for a sufficient number of repetitions until the measurable capacitance can be detected. Such a detection scheme may be readily implemented using conventional components, and can be particularly useful in sensing the position of a finger, stylus or other object with respect to a button, slider, touchpad or other input sensor.

Claims

1. An electric circuit for measuring a capacitance value, the electric circuit comprising:

a first switch coupled to a first capacitance;

an integrating capacitance coupled to the first capacitance, wherein the integrating capacitance is configured to accumulate charge received from the first capacitance;

a charge changing circuit coupled to the integrating capacitance; and

a controller configured to measure the capacitance value by repeatedly applying a voltage to the first capacitance using the first switch, repeatedly accumulating charge received from the first capacitance on the integrating capacitance, and repeatedly changing a charge on the integrating capacitance using the charge changing circuit in response to a voltage on the integrating capacitance being past a threshold of a quantizer.

2. The electric circuit of claim 1 wherein the charge changing circuit comprises a resistor.

3. The electric circuit of claim 2, wherein the controller is further configured to change the charge on the integrating capacitance by activating a second switch for a period of time, thereby allowing charge on the integrating capacitance to pass through the resistor.

4. The electric circuit of claim 3 wherein the charge changing circuit is controlled by an output of the quantizer.

5. The electric circuit of claim 3 wherein the controller is further configured to change the charge on the integrating capacitance by activating the second switch for a period of time by:

activating the second switch for an amount of time determined by an output of the quantizer.

6. The electric circuit of claim 1 wherein the quantizer comprises a comparator.

7. The electric circuit of claim 1 wherein the quantizer comprises a comparator coupled to a latch, where the latch includes an output, and wherein the output of the latch is coupled to the charge changing circuit.

8. The electric circuit of claim 1 wherein the capacitance value is of the first capacitance.

9. The electric circuit of claim 1 wherein the quantizer generates outputs reflective of whether the voltage on the integrating capacitance is past the threshold of the quantizer, and wherein the outputs of the quantizer are filtered to determine the capacitance value.

10. The electric circuit of claim 1 wherein the quantizer generates outputs reflective of whether the voltage on the integrating capacitance is past the threshold of the quantizer, and wherein the outputs of the quantizer are counted for a duration of time to determine the capacitance value.

11. The electric circuit of claim 1 wherein the controller is configured to measure the capacitance value by repeatedly changing the charge on the integrating capacitance using the charge changing circuit in response to the voltage on the passive network being past a threshold of a quantizer by:

repeatedly changing the charge on the integrating capacitance in a way that maintains a voltage on the integrating capacitance near the threshold of the quantizer.

12. A system for determining a capacitance value of a measurable capacitance, the system comprising:

an integrating capacitance configured to store charge received from the measurable capacitance;

a charge changing circuit coupled to the integrating capacitance; and

a controller configured to determine the capacitance value by repeatedly applying a predetermined voltage to the measurable capacitance, repeatedly sharing charge between the measurable capacitance and the integrating capacitance to accumulate charge on the integrating capacitance, repeatedly measuring a voltage on the integrating capacitance using a quantizer of the controller and generating quantized values responsive to the repeated measurings, repeatedly changing charge on the integrating capacitance based on the quantized values using the charge changing circuit, and determining the capacitance value of the measurable capacitance from the quantized values.

13. The system of claim 12 wherein the charge changing circuit comprises a resistor.

16. The system of claim 12 wherein the quantizer comprises a comparator.

17. The system of claim 12 wherein the quantizer comprises a comparator coupled to a latch, where the latch includes an output, and wherein the output of the latch is coupled to the charge changing circuit.

18. The system of claim 12 wherein the controller is configured to filter the quantized values to determine the capacitance value of the measurable capacitance from the quantized values.

19. The system of claim 12 wherein the controller is configured to count the quantized values within a period of time to determine the capacitance value of the measurable capacitance from the quantized values.

20. The system of claim 12 wherein controller is configured such that the repeatedly changing of the charge on the integrating capacitance based on the quantized values using the charge changing circuit maintains a voltage on the integrating capacitance near the threshold of the quantizer.

14. The system of claim 14 wherein the controller is further configured to change the charge on the integrating capacitance by passing charge on the integrating capacitance through the resistor for a period of time.

15. The system of claim 14 wherein the period of time is determined at least in part by the quantized values.

21. A method for determining a capacitance value, the method comprising the steps of:

applying a voltage to the first capacitance using a first switch;

allowing the first capacitance to share charge with an integrating capacitance;

outputting a quantized value reflective of whether the voltage on the integrating capacitance is past a threshold of a quantizer;

changing a charge on the integrating capacitance by an amount of charge responsive to the voltage on the integrating capacitance being past the threshold of the quantizer, wherein the amount of charge is determined at least in part as a function of the quantized value outputted by the quantizer;

repeating each of the applying step, the allowing step, the outputting, and the changing step at least once to generate a plurality of quantized values; and

determining the capacitance value using the plurality of quantized values generated by the repeating step.

22. The method of claim 21 wherein the step of changing a charge on the integrating capacitance by an amount of charge comprises passing charge on the integrating capacitance to through a resistor for a period of time.

23. The method of claim 22 wherein the period of time is determined at least in part by the quantized value outputted by the quantizer.

24. The method of claim 21 wherein the quantizer comprises a comparator coupled to a latch, where the latch includes an output, and wherein the output of the latch is coupled to the charge changing circuit.

25. The method of claim 21 wherein determining the capacitance value using the plurality of quantized values generated by the repeating step comprises filtering the quantized values.

26. The method of claim 21 wherein determining the capacitance value using the plurality of quantized values generated by the repeating step comprises counting the plurality of quantized values generated within a period of time by the repeating step.

27. The method of claim 21 wherein the repeating of the applying step, the allowing step, and the changing step maintains the voltage on the integrating capacitance near the threshold of the quantizer.