SCHLIEREN-TYPE RADIOGRAPHY USING A LINE SOURCE AND FOCUSING OPTICS

• US 20090060134A1
• Filed: 11/17/2007
• Published: 03/05/2009
• Est. Priority Date: 11/20/2006
• Status: Active Grant

• Current Assignee: Michael Keith Fuller
• Original Assignee: Michael Keith Fuller
• Inventors: Fuller, Michael Keith
• Granted Patent: US 7,505,561 B1
• Time in Patent Office: Days
• US Class Current: 378/85
• CPC Class Codes: A61B 6/00 Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment instruments measuring radiation intensity for application in the field of nuclear medicine, e.g. in vivo counting, G01T1/161; apparatus for taking X-ray photographs G03B42/02
• CPC Class Codes: A61B 6/4092 for producing synchrotron radiation
• CPC Class Codes: A61B 6/482 involving multiple energy imaging
• CPC Class Codes: A61B 6/484 involving phase contrast X-ray imaging
• CPC Class Codes: G01N 2223/076 X-ray fluorescence
• CPC Class Codes: G01N 23/04 and forming images of the material
• CPC Class Codes: G01N 23/223 by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
• CPC Class Codes: G21K 2201/06 using diffractive, refractive or reflecting elements

Abstract

A system for observing the internal features of an object, such that the object'"'"'s internal absorption, refraction, reflection and/or scattering properties are visualized, is disclosed. An embodiment may include one or more beams of penetrating radiation, an object with internal features to be imaged, a single or an array of radiation optics, and a detection system for capturing the resultant shadowgraph images. The beam(s) of radiation transmitted through the object typically originate from a line-shaped source(s), which has high spatial purity along the narrow axis, and low spatial purity in the perpendicular, long axis. In the long axis, radiation optic(s) capture and focus diverging rays exiting from the object to form a high resolution image of the object, without which optic(s) the shadowgraph would have blurring in this axis. Such shadowgraph is naturally well defined in the opposite axis of narrow beam origin and can reveal an object'"'"'s refraction, reflection and/or scattering properties along that axis. An embodiment may also include discriminators (stops, phase shifters, analyzer crystals, etc.) in the beam exiting the object. An embodiment may also include mechanisms for scanning whereby a two-dimensional or three-dimensional image of a large object is made possible. An embodiment may also include an image of an object'"'"'s internal features being derived from an analysis of the radiation and/or radiation waveform exiting the object.

Claims

1. A system for forming an image of an object, said image including internal features of said object, said system comprising:

means for generating a penetrating radiation beam;

said means for generating having one or more line origin(s) for generating said beam providing that said beam has high spatial purity along a narrow axis of said beam origin(s) and low spatial purity along a long axis of said beam origin(s);

a radiation imaging optic;

means for supporting said object to provide that said beam is directed through said object and through said radiation imaging optic;

said radiation imaging optic arranged to form at least a partial image of said object presented on a detector screen;

said partial image including at least one of phase and scattering content of said object'"'"'s internal features in a direction along one axis of said beam

2. The system of claim 1 wherein said radiation imaging optic is arranged to collect and focus said partial image in two dimensions.

3. The system of claim 1 wherein said radiation imaging optic is arranged to collect and focus said partial image in one dimension with an axis of ray collection and focusing aligned with a long dimension of said line origin of radiation beam.

4. The system of claim 2 comprising:

a far field detector;

one of a stop and phase shift filter;

said radiation image optic arranged to focus an image of said line radiation origin exactly upon said one of a stop and phase shifter and permit another image of said object to be focused on said far field detector; and

said another image of said object comprising rays deviated by refraction and/or scattering properties of said object'"'"'s internal features.

5. The system of claim 3 wherein said radiation image optic comprises crystals being one of:

A.) bent monochromator crystals;

B.) curved multilayer synthetic crystals;

for diffracting said radiation beam providing that an image of said line origin is focused exactly on one of;

A.) a stop;

B.) a phase shifter

providing that said image focused at a far field detector comprises rays deviated by said internal features of said object.

6. The system of claim 3 wherein:

said means for generating a radiation beam generates a beam having one part and another part;

said one part generated by one transmission energy;

and focused onto a detector by said radiation imaging optic at a particular focal distance from said object;

said another part generated by another transmission energy and focused onto a detector by said radiation imaging optic at a different focal distance from said object; and

wherein at least two images are detected, each for different transmitted energies, and a phase and/or absorption image is derived from an analysis of the two detected images.

7. The system of claim 6 wherein said image analysis is arranged to derive said phase responsive image separate from said absorption image for separate analysis of chemical elemental dependent features, such as from contrast media, of said object.

8. A system for displaying an image of at least one phase related and absorption related features of an object, said system comprising;

line origin means for projecting a radiation beam;

monochromator crystals arranged for diffracting said radiation beam in the narrow axis of said line origin;

means for supporting said object to permit transmitting said beam through said object;

a radiation imaging optic;

means for generating an image from said image signal and enabling a viewer to analyze said image for phase and absorption related features in one axis of said object.

9. A system for displaying an image of at least one phase related and absorption related features of an object, said system comprising;

line origin means for projecting a radiation beam;

monochromator crystals arranged for diffracting said radiation beam in the narrow axis of said line origin;

means for supporting said object to permit transmitting said beam through said object;

a structured multilayer analyzer arranged to receive a portion of said transmitted beam at an angle of incidence whereby all rays not deviated by features of the object are not allowed to reflect;

a radiation imaging optic;

means for transmitting said portion of said beam from said structured multilayer analyzer through said radiation imaging optic;

to generate an image signal;

means for generating an image from said image signal and enabling a viewer to analyze said image for phase and scattering related features in said object, with absorption related features suppressed.

10. A system for displaying an image of at least one phase related and absorption related features of an object, said system comprising;

line origin means for projecting a radiation beam;

monochromator crystals arranged for diffracting said radiation beam;

means for supporting said object to permit transmitting said beam through said object;

a crystal analyzer arranged to receive a portion of said transmitted beam at an angle of incidence;

a radiation imaging optic;

means for transmitting said portion of said beam from said crystal analyzer through said radiation imaging optic;

to generate an image signal;

means for generating an image from said image signal and enabling a viewer to analyze said image for phase and absorption related features in said object.

11. The system of claim 10 wherein said crystal analyzer is a Bragg analyzer.

12. The system of claim 10 wherein said crystal analyzer is a Laue analyzer.

13. The system of claim 10 wherein said radiation imaging system comprises:

means for generating a first image signal from a portion of said beam emitted at a first angular position relative to said crystal analyzer;

means for generating a second image signal from a portion of said beam emitted at a second angular position relative to said crystal analyzer;

means for combining said first and second image signals to generate a combined image signal;

means for generating a combined image from said combined image signal having phase and scattering content on one axis.

14. The system of claim 10 wherein said first and second angular positions are within a rocking curve of said crystal analyzer.

15. The system of claim 10 wherein said first angular position is a low rocking angle setting and said second angular position is a high rocking angle setting of said crystal analyzer.

16. The system of claim 10 wherein said first and second image signals are digital.

17. The system of claim 10 wherein said combined image is a digital combined signal from which is generated a combined image enhanced by said at least one of phase related and absorption related features of said object.

18. A system for deriving an image of at least one phase related feature of an object, said system comprising;

A first array of near identical radiation one-dimensional focusing optics, and a second array of near identical radiation one-dimensional focusing optics set at ninety degrees to said first array;

said first array of radiation one-dimensional focusing optics aligned parallel to the long axis of beam origin;

said first array of radiation one-dimensional focusing optics positioned such that the detector is at a distance exactly the equal the focal length of radiation one-dimensional focusing optics;

said detector having a greater number of resolution elements than the total number of radiation one-dimensional focusing optics in said first array;

said resolution elements being segregated to detect a line focus of radiation from only one radiation focusing optic in said first array;

said resolution elements measuring the effect of radiation beam phase change generated by said refractive properties of said internal features of said object by associated change in position of portions of said line focus of radiation;

said second array of near identical radiation one-dimensional focusing optics aligned perpendicular to the long axis of beam origin;

said second array of radiation one-dimensional focusing optics positioned such that the detector is at a distance such that an image of the object is produced in one line on the detector, with individual segments of said line capturing transmitted radiation from individual portions of said object;

a calculation performed on said measured effects determining the distortion of the radiation wavefront;

an image of one axis of object'"'"'s internal refraction properties being derived from a Shack-Hartmann analysis of said distorted radiation wavefront.

19. The system of claim 18 wherein the system for deriving an image of at least one phase related feature of an object comprises;

short line origin (near-point) means for projecting a radiation beam;

monochromator crystals arranged for diffracting said radiation beam in one axis;

means for supporting said object to permit transmitting said beam through said object;

an array of near identical radiation two-dimensional focusing optics;

said array of radiation two-dimensional focusing optics positioned such that the detector is at a distance exactly the equal the focal length of radiation two-dimensional focusing optics;

said detector having a greater number of resolution elements than the total number of radiation two-dimensional focusing optics in said array;

said resolution elements being segregated to detect a point focus of radiation from only one radiation two-dimensional focusing optic in said array;

said resolution elements measuring the effect of radiation beam phase change generated by said refractive properties of said internal features of said object by associated change in position of said point focus of radiation;

a calculation performed on said measured effects determining the distortion of the radiation wavefront;

an image of both axes of object'"'"'s internal refraction properties being derived from a Shack-Hartmann analysis of said distorted radiation wavefront.