Ultrasound system

• US 20090248364A1
• Filed: 04/24/2009
• Published: 10/01/2009
• Est. Priority Date: 07/11/2007
• Status: Active Grant

• Current Assignee: William L. Puskas
• Original Assignee: William L. Puskas
• Inventors: Puskas, William L.
• Granted Patent: US 7,777,393 B2
• Time in Patent Office: Days
• US Class Current: 702/185
• CPC Class Codes: B06B 1/0284 with consecutive, i.e. sequential generation, e.g. with frequency sweep
• CPC Class Codes: B08B 3/12 by sonic or ultrasonic vibrations washing or rinsing machines for crockery or tableware using sonic or ultrasonic waves A47L15/13; of natural teeth, of prostheses using ultrasonic techniques similar to those used for natural teeth A61C17/20; application of ultrasonic vibrations to chemical, physical or physico-chemical processes in general B01J19/10

Abstract

An ultrasound system for providing megasonics and ultrasonics to a liquid at different frequencies and/or sweeping frequencies with associated generators, transducers, operations between resonance and anti-resonance, non-resistive output with phase shift, multiple/sweep/single frequency modes, individually controlled sections, gate drive power control, variable inductive compensation for temperature changes, parallel inductor matching, stacked ceramics and non-volatile memory storage of fault, error and failure history.

Claims

1. An ultrasound system comprising:

a generator for generating a driving signal to power an ultrasound transducer assembly;

at least one sensor adapted to sense operating conditions of said generator;

a processor communicating with said sensor;

non-volatile memory coupled to said processor; and

said processor programmed to receive a signal from said sensor during operation of said generator and to store said signal in said memory for access after operation of said generator when said signal indicates a system error, fault or failure;

whereby a history of said faults, errors or failures is available after said generator is powered down.

2. An ultrasound system according to claim 1, wherein said processor is selected from a group consisting of digital integrated circuits, programmable logic controllers or computers commonly referred to as microprocessors, microcontrollers, CPUs, PICs, PLCs, PCs and microcomputers.

3. An ultrasound system according to claim 1, wherein said non-volatile memory is selected from a group consisting of flash memory, EEPROM, magnetic memory and optical memory.

4. An ultrasound system according to claim 1, wherein said ultrasound system is operable at a phase lock loop frequency.

5. An ultrasound system according to claim 1, wherein said ultrasound transducer assembly is configured and arranged to couple megasonics to liquid, to couple ultrasonics to liquid, to couple ultrasonics to solid, or to couple ultrasonics to a gas.

6. An ultrasound system according to claim 1, wherein said non-volatile memory is RAM powered by a battery.

7. An ultrasound system according to claim 1, wherein said fault, error or failure is selected from a group consisting of a low power line voltage condition, a high power line current draw, an over voltage power line condition, an over temperature condition, an over voltage ultrasound driving signal, an over current ultrasound driving signal, an under voltage ultrasound driving signal, an under current ultrasound driving signal, an unlocked PLL condition, an out of specification phase shift condition, an ultrasound drive frequency over a maximum limit, an ultrasound drive frequency under a minimum limit, an excessive reflected power condition, an open ultrasound transducer assembly, a shorted ultrasound transducer assembly, an ultrasound transducer assembly over a maximum capacitance value, an ultrasound transducer assembly under a minimum capacitance value, a high impedance ultrasound transducer assembly, a low impedance ultrasound transducer assembly, a missing interlock, incorrect output power, loss of closed loop output power control, a start up sequence error, an aborted start up sequence, and a shut down sequence error.

8. An ultrasound system comprising:

an electronic bridge circuit that provides an operational ultrasound frequency or operational bandwidth of frequencies and has a first output terminal and a second output terminal configured to provide an output voltage and an output current;

a phase shift network having a first input terminal, a second input terminal, a first output terminal and a second output terminal;

said first output terminal of said electronic bridge circuit coupled to said first input terminal of said phase shift network and said second output terminal of said electronic bridge circuit coupled to said second input terminal of said phase shift network;

an ultrasound transducer having a first input terminal and a second input terminal, said first output terminal of said phase shift network coupled to said first input terminal of said ultrasound transducer and said second output terminal of said phase shift network coupled to said second input terminal of said ultrasound transducer;

at least one sensor adapted to sense operating conditions of said ultrasound system;

a processor communicating with said sensor;

non-volatile memory coupled to said processor;

said electronic bridge circuit, said phase shift network and said ultrasound transducer configured such that said output voltage leads said output current by an angle that is greater than 0 degrees and less than about 90 degrees for said operational ultrasound frequency or bandwidth of frequencies; and

said processor programmed to receive a signal from said sensor during operation of said ultrasound system and to store said signal in said memory for access after operation of said ultrasound system when said signal indicates a system error, fault or failure;

whereby a history of said faults, errors or failures is available after said ultrasound system is powered down.

9. An ultrasound system according to claim 8, wherein said electronic bridge circuit comprises:

a loop inductance of between about 3 nanohenrys and about 27 nanohenrys; and

at least one gate drive dead time of between about 97 nanoseconds and about 787 nanoseconds.

10. An ultrasound system according to claim 8, wherein said electronic bridge circuit comprises at least one power MOSFET transistor as a switching device.

11. An ultrasound system according to claim 8, wherein said output voltage leads said output current by an angle that varies as a function g(f) of the frequency over said operational bandwidth of frequencies to produce a specified function h(f) for power versus frequency over said operational bandwidth of frequencies.

12. An ultrasound system according to claim 8, wherein said processor is selected from a group consisting of digital integrated circuits, programmable logic controllers, microprocessors, microcontrollers, CPUs, PICs, PLCs, PCs and microcomputers.

13. An ultrasound system according to claim 8, wherein said non-volatile memory is selected from a group consisting of flash memory, EEPROM, magnetic memory and optical memory.

14. An ultrasound system according to claim 8, wherein said fault, error or failure is selected from a group consisting of a low power line voltage condition, a high power line current draw, an over voltage power line condition, an over temperature condition, an over voltage ultrasound driving signal, an over current ultrasound driving signal, an under voltage ultrasound driving signal, an under current ultrasound driving signal, an unlocked PLL condition, an out of specification phase shift condition, an ultrasound drive frequency over a maximum limit, an ultrasound drive frequency under a minimum limit, an excessive reflected power condition, an open ultrasound transducer assembly, a shorted ultrasound transducer assembly, an ultrasound transducer assembly over a maximum capacitance value, an ultrasound transducer assembly under a minimum capacitance value, a high impedance ultrasound transducer assembly, a low impedance ultrasound transducer assembly, a missing interlock, incorrect output power, loss of closed loop output power control, a start up sequence error, an aborted start up sequence, and a shut down sequence error.