Analysis method using finite element method, program causing computer to execute same, and system for same

• US 20090312991A1
• Filed: 08/17/2009
• Published: 12/17/2009
• Est. Priority Date: 05/31/2001
• Status: Active Grant

• Current Assignee: NEC Corporation
• Original Assignee: NEC Corporation
• Inventors: HIRATA, Ichiro
• Granted Patent: US 8,229,712 B2
• Time in Patent Office: Days
• US Class Current: 703/2
• CPC Class Codes: G06F 30/23 using finite element methods [FEM] or finite difference methods [FDM]

Abstract

An FEM analysis system is provided which is capable of analyzing with high accuracy and within a short time in a drop shock analysis of electronic devices in which a very small mesh size is incorporated. Processing to be performed by an optimal solution selecting and analyzing section includes a step of checking whether an analysis to be performed is a shock analysis, a step of searching for a minimum mesh size when the analysis to be performed is judged to be a shock analysis, a step of creating a simplified analysis model using the minimum mesh size, a step of performing a preliminary analysis on a simplified model by an implicit method and explicit method, and a step of selecting either of the implicit method or explicit method as an optimal analysis method by comparing results from preliminary analysis, results from these analyses and experiments or exact solution.

Claims

1. An analysis method for performing a stress analysis of a device using a finite element method to analyze an analysis model having meshes that define a discretized shape of the device, the analysis method implemented in a computer, the analysis method comprising:

searching for a minimum mesh size out of the meshes of the analysis model;

creating a second analysis model having one or more meshes that define a different shape as compared to the discretized shape of the device using the minimum mesh size, wherein the second analysis model is different from the analysis model;

analyzing the second analysis model by using an implicit method to obtain a first value that comprises an analysis time required for analyzing the second analysis model using the implicit method;

analyzing the second analysis model by using an explicit method to obtain a second value that comprises an analysis time required for analyzing the second analysis model using the explicit method;

comparing the first value or a value based on the first value with the second value or a value based on the second value to obtain a comparison result;

selecting one of the implicit method and the explicit method as an optimal method to be used to analyze the analysis model based on the comparison result;

analyzing the analysis model using the optimal method to obtain an analysis result for the stress analysis of the device, the analysis result including data on at least one of displacement, stress, or distortion; and

storing the analysis result in a storage medium.

2. The analysis method of claim 1, wherein analyzing the analysis model using the optimal method, comprises:

analyzing the analysis model using only the optimal method to obtain the analysis result.

3. The analysis method of claim 1,

wherein the different shape is a simplified shape as compared to the discretized shape.

4. The analysis method of claim 1,

wherein the second analysis model is a simplified analysis model as compared to the analysis model.

5. The analysis method of claim 1,

wherein the comparing step comprises comparing the first value with the second value to obtain the comparison result.

6. The analysis method of claim 1,

wherein the first value includes data on one of displacement, stress, or distortion obtained from the implicit method when analyzing the second analysis model;

and

wherein the second value includes data on one of displacement, stress, or distortion obtained from the explicit method when analyzing the second analysis model.

7. The analysis method of claim 6, wherein the comparing step comprises:

calculating a third value as an absolute value of a difference between an expected value and the first value;

calculating a fourth value as an absolute value of a difference between the expected value and the second value; and

comparing the third value with the fourth value to obtain the comparison result.

8. A computer-readable storage medium storing a program for causing a computer to execute an analysis process for performing a stress analysis of a device using a finite element method to analyze an analysis model having meshes that define a discretized shape of the device, the analysis process comprising:

searching for a minimum mesh size out of the meshes of the analysis model;

creating a second analysis model having one or more meshes that define a different shape as compared to the discretized shape of the device using the minimum mesh size, wherein the second analysis model is different from the analysis model;

analyzing the second analysis model by using an implicit method to obtain a first value that comprises an analysis time required for analyzing the second analysis model using the implicit method;

analyzing the second analysis model using an explicit method to obtain a second value that comprises an analysis time required for analyzing the second analysis model using the explicit method;

comparing the first value or a value based on the first value with the second value or a value based on the second value to obtain a comparison result;

selecting one of the implicit method and the explicit method as an optimal method to be used to analyze the analysis model based on the comparison result;

analyzing the analysis model by using the optimal method to obtain an analysis result for the stress analysis of the device, the analysis result including data on at least one of displacement, stress, or distortion; and

storing the analysis result in a storage medium.

9. The computer-readable storage medium of claim 8,

wherein analyzing the analysis model using the optimal method, comprises:

analyzing the analysis model using only the optimal method to obtain the analysis result.

10. The computer-readable storage medium of claim 8,

wherein the comparing step comprises comparing the first value with the second value to obtain the comparison result.

11. The computer-readable storage medium of claim 8,

wherein the first value includes data on one of displacement, stress, or distortion obtained from the implicit method when analyzing the second analysis model;

and

wherein the second value includes data on one of displacement, stress, or distortion obtained from the explicit method when analyzing the second analysis model.

12. The computer-readable storage medium of claim 11, wherein the comparing step comprises:

calculating a third value as an absolute value of a difference between an expected value and the first value;

calculating a fourth value as an absolute value of a difference between the expected value and the second value; and

comparing the third value with the fourth value to obtain the comparison result.

13. A finite element method analysis system for performing a stress analysis of a device, the finite element method analysis system comprising a computer configured to:

create an analysis model having meshes that define a discretized shape of the device;

search for a minimum mesh size out of the meshes of the analysis model;

create a second analysis model having one or more meshes that define a different shape as compared to the discretized shape of the device using the minimum mesh size, wherein the second analysis model is different from the analysis model;

analyze the second analysis model by using an implicit method to obtain a first value that comprises an analysis time required for analyzing the second analysis model using the implicit method;

analyze the second analysis model by using an explicit method to obtain a second value that comprises an analysis time required for analyzing the second analysis model using the explicit method;

compare the first value or a value based on the first value with the second value or a value based on the second value to obtain a comparison result;

select one of the implicit method and the explicit method as an optimal method to be used to analyze the analysis model based on the comparison result;

analyze the analysis model using the optimal method to obtain an analysis result for the stress analysis of the device, the analysis result including data on at least one of displacement, stress, or distortion; and

store the analysis result in a storage medium.

14. The finite element method analysis system of claim 13,

wherein the computer is configured to analyze the analysis model using only the optimal method to obtain the analysis result.

15. The finite element method analysis system of claim 13,

wherein the computer is configured to compare the first value with the second value to obtain the comparison result.

16. The finite element method analysis system of claim 13,

wherein the first value includes data on one of displacement, stress, or distortion obtained from the implicit method when analyzing the second analysis model;

and

wherein the second value includes data on one of displacement, stress, or distortion obtained from the explicit method when analyzing the second analysis model.