INSPECTION SYSTEM AND METHOD

• US 20100007896A1
• Filed: 09/25/2009
• Published: 01/14/2010
• Est. Priority Date: 04/03/2007
• Status: Active Grant

• Current Assignee: David Fishbaine
• Original Assignee: David Fishbaine
• Inventors: Fishbaine, David
• Granted Patent: US 8,243,285 B2
• Time in Patent Office: Days
• US Class Current: 356/603
• CPC Class Codes: G01B 11/25 by projecting a pattern, e.g. one or more lines, moiré fringes on the object G01B11/255 takes precedence ; image analysis for depth or shape recovery G06T7/50
• CPC Class Codes: G01N 2021/8835 Adjustable illumination, e.g. software adjustable screen
• CPC Class Codes: G01N 21/8806 Specially adapted optical and illumination features
• CPC Class Codes: G01N 21/95684 Patterns showing highly reflecting parts, e.g. metallic elements

Abstract

A manufacturing method and system are disclosed for illuminating a target. A light controller has a plurality of pixels, and light is projected from at least a first light source to the light controller, wherein the light from the first light source is incident on the light controller at a first angle. The pixels are controlled to establish illumination characteristics for first and second optical paths between the light controller and the target.

Claims

1. A manufacturing method including illuminating a target, comprising:

providing a light controller having a plurality of pixels;

projecting light from a first light source to the light controller, wherein the light from the first light source is incident on the light controller at a first angle;

providing first and second optical paths between the light controller and the target;

controlling the pixels to establish illumination characteristics for the first optical path and the second optical path.

2. The method of claim 1, further comprising:

projecting light from a second light source to the light controller, wherein the light from the second light source is incident on the light controller at a second angle.

3. The method of claim 1, wherein providing the first and second optical paths includes controlling the pixels.

4. The method of claim 1, wherein controlling the pixels to establish illumination characteristics includes:

controlling the pixels to establish first illumination characteristics for the first optical path and; and

controlling the pixels to establish second illumination characteristics for the second optical path.

5. The method of claim 1, wherein the illumination characteristics are selected from a group comprising:

phase;

wavelength;

wave direction;

illumination azimuth angle;

illumination elevation angle;

magnification;

depth of field; and

non-repetitive pattern.

6. The method of claim 2, further comprising:

establishing a third optical path between the light controller and the target;

projecting light from a third light source to the light controller, wherein the light from the third light source is incident on the light controller at a third angle; and

controlling the pixels to establish illumination characteristics for the third optical path.

7. The method of claim 1, wherein controlling the pixels includes controlling transparency of the pixels.

8. The method of claim 2, wherein controlling the pixels includes reflecting light from the light source.

9. The method of claim 1, wherein controlling the pixels includes patterning the light from the light source.

10. The method of claim 2, wherein controlling the pixels includes patterning the light from the light source.

11. The method of claim 1, wherein the target is a surface of a part, and wherein the method further comprises assembling the part into a final assembly.

12. The method of claim 11, wherein the part is an electronic component, and wherein the method further comprises mounting the electronic component on a circuit board.

13. An inspection system, comprising:

a light controller having a plurality of pixels;

a first light source arranged to project light incident on the light controller at a first angle;

wherein the light controller is operable to control the pixels to establish illumination characteristics for first and second optical paths between the light controller and a target.

14. The inspection system of claim 13, wherein the light controller includes a transmissive LCD operable to establish the first and second optical paths.

15. The inspection system of claim 13, wherein the light controller is operable to control the pixels to establish respective first and second illumination characteristics for the first and second optical paths.

16. The inspection system of claim 13, further comprising a second light source arranged to project light incident on the light controller at a second angle.

17. The inspection system of claim 16 wherein the light controller includes a micro-mirror array.

18. The inspection system of claim 16, wherein the light controller includes a liquid crystal on silicon array.

19. The inspection system of claim 16, comprising a third light source arranged to project light incident on the light controller at a third angle, and wherein the light controller is operable to control the pixels to establish third illumination characteristics for a third optical path.