DICHROIC BEAMSPLITTER FOR HIGH ENERGY LASER DIAGNOSTICS
First Claim
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1. A system, comprising:
- an optical cavity resonant at a first wavelength;
a probe laser for producing a probe beam at a second wavelength;
a beam splitter (BS) and a deformable mirror located in said cavity, said BS having a first surface with a dichroic coating, said BS having a second surface with an antireflection coating;
an optical flat designed to reflect said second wavelength; and
a wavefront sensor (WFS);
wherein said probe beam is operatively positioned to be aligned for transmission through said BS and then to be reflected from said flat, wherein a first portion of said probe beam reflected from said flat will propagate through said BS to said WFS, wherein a second portion of said beam will be reflected by said dichroic coating and make one complete oscillation through said cavity and then propagate to said WFS. amplifier.
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Abstract
Wavefront control techniques are provided for the alignment and performance optimization of optical devices. A Shack-Hartmann wavefront sensor can be used to measure the wavefront distortion and a control system generates feedback error signal to optics inside the device to correct the wavefront. The system can be calibrated with a low-average-power probe laser. An optical element is provided to couple the optical device to a diagnostic/control package in a way that optimizes both the output power of the optical device and the coupling of the probe light into the diagnostics.
13 Citations
21 Claims
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1. A system, comprising:
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an optical cavity resonant at a first wavelength; a probe laser for producing a probe beam at a second wavelength; a beam splitter (BS) and a deformable mirror located in said cavity, said BS having a first surface with a dichroic coating, said BS having a second surface with an antireflection coating; an optical flat designed to reflect said second wavelength; and a wavefront sensor (WFS); wherein said probe beam is operatively positioned to be aligned for transmission through said BS and then to be reflected from said flat, wherein a first portion of said probe beam reflected from said flat will propagate through said BS to said WFS, wherein a second portion of said beam will be reflected by said dichroic coating and make one complete oscillation through said cavity and then propagate to said WFS. amplifier. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A method for aligning an optical cavity resonant at a first wavelength, comprising:
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locating a beam splitter (BS) and a deformable mirror in said cavity, said BS having a first surface with a dichroic coating, said BS having a second surface with an antireflection coating; and aligning a probe beam for transmission through said BS, wherein said probe beam comprises a second wavelength, wherein after transmission of said probe beam through said BS, said probe beam will then be reflected from an optical flat, wherein a first portion of said probe beam reflected from said flat will propagate through said BS to a wavefront sensor (WFS), wherein a second portion of said probe beam will be reflected by said dichroic coating and make one complete oscillation through said cavity and then propagate to said WFS. - View Dependent Claims (14, 15, 16, 17, 18, 19)
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20. An alignment system for aligning an optical system, wherein said optical system is capable of being aligned to have an optimum alignment at a first wavelength, wherein said optimum alignment is defined as a best alignment attainable under ambient conditions, wherein said alignment system comprises:
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a probe laser for producing a probe beam at a second wavelength; a beam splitter (BS) and a deformable mirror located in said optical system, said BS having a first surface with a dichroic coating, said BS having a second surface with an antireflection coating; an optical flat designed to reflect said second wavelength; and a wavefront sensor (WFS); wherein said probe beam is positionable to be aligned for transmission through said BS and then to be reflected from said flat, wherein a first portion of said probe beam reflected from said flat will propagate through said BS to said WFS, wherein a second portion of said beam will be reflected by said dichroic coating and will then propagate in said optical system and will then propagate to said WFS.
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21. A method for aligning an optical system, wherein said optical system is capable of being aligned to have an optimum alignment at a first wavelength, wherein said optimum alignment is defined as a best alignment attainable under ambient conditions, wherein said method comprises:
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locating a beam splitter (BS) and a deformable mirror in said optical system, said BS having a first surface with a dichroic coating, said BS having a second surface with an antireflection coating; and aligning a probe beam for transmission through said BS, wherein said probe beam comprises a second wavelength, wherein said probe beam will then be reflected from an optical flat, wherein a first portion of said probe beam reflected from said flat will propagate through said BS to a wavefront sensor (WFS), wherein a second portion of said probe beam will be reflected by said dichroic coating and will propagate in said optical system and will then propagate to said WFS.
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Specification