Detection and Removal of Blemishes in Digital Images Utilizing Original Images of Defocused Scenes
First Claim
6. A digital image acquisition device having no photographic film, comprising an optical system, a processor and one or more storage devices for programming the processor to control the camera to perform a method of automatically correcting color or luminance defect conditions, or a combination thereof, within acquired images, the method comprising:
- acquiring one or more original digital images through a translucent lens cap disposed along an optical-path between an object and one or more components of the optical system including a digital sensor;
determining probabilities that certain pixels correspond to color or luminance defect regions, or a combination thereof, within said one or more original digital images;
associating the color and/or luminance defect regions with one or more acquisition parameters when the one or more original digital images were acquired;
forming a statistical color and/or luminance defect map including mapped color and/or luminance defect regions based on the color and/or luminance defect region probability determining and associating; and
correcting pixels corresponding to color and/or luminance defect regions within each of said one or more original images based on the associated statistical color and/or luminance defect map.
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Accused Products
Abstract
A method automatically corrects dust artifact within image acquired by a system including a digital acquisition device including a lens assembly and a translucent lens cap. Multiple original digital images are acquired with the digital acquisition device. Probabilities that certain pixels correspond to dust artifact regions within the images are determined based at least in part on a comparison of suspected dust artifact regions within two or more of the images. Probable dust artifact regions are associated with extracted parameter values relating to the lens assembly when the images were acquired, A statistical dust map is formed including mapped dust regions based on the determining and associating. Pixels corresponding to correlated dust artifact regions are corrected within further digitally-acquired images based on the associated statistical dust map.
112 Citations
18 Claims
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6. A digital image acquisition device having no photographic film, comprising an optical system, a processor and one or more storage devices for programming the processor to control the camera to perform a method of automatically correcting color or luminance defect conditions, or a combination thereof, within acquired images, the method comprising:
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acquiring one or more original digital images through a translucent lens cap disposed along an optical-path between an object and one or more components of the optical system including a digital sensor; determining probabilities that certain pixels correspond to color or luminance defect regions, or a combination thereof, within said one or more original digital images; associating the color and/or luminance defect regions with one or more acquisition parameters when the one or more original digital images were acquired; forming a statistical color and/or luminance defect map including mapped color and/or luminance defect regions based on the color and/or luminance defect region probability determining and associating; and correcting pixels corresponding to color and/or luminance defect regions within each of said one or more original images based on the associated statistical color and/or luminance defect map. - View Dependent Claims (1, 2, 3, 4, 5, 7, 8, 9, 10, 11, 12, 13, 15, 16, 17, 18)
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17-1. The device of claim 6, the defect region determining including:
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loading the statistical defect map; loading acquisition condition information of a present image; performing a calculation for relating the statistical defect map with the present image according to a selected value of an acquisition condition which is otherwise uncorrected between the present image and the defect map; and comparing defect artifact detection data with the now correlated statistical defect map data.
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Specification