SYSTEM AND METHOD FOR STRONG PHOTON LOCALIZATION BY DISORDERED PHOTONIC CRYSTAL STRUCTURES

• US 20100176200A1
• Filed: 06/04/2008
• Published: 07/15/2010
• Est. Priority Date: 06/04/2007
• Status: Active Grant

• Current Assignee: President and Fellows of Harvard College (Harvard Corporation)
• Original Assignee: President and Fellows of Harvard College (Harvard Corporation)
• Inventors: Topolancik, Juraj, Vollmer, Frank
• Granted Patent: US 8,701,998 B2
• Time in Patent Office: Days
• US Class Current: 235/462.10
• CPC Class Codes: G01N 21/774 the reagent being on a grating or periodic structure
• CPC Class Codes: G01N 21/7743 the reagent-coated grating coupling light in or out of the waveguide
• CPC Class Codes: G02B 2006/12164 Multiplexing; Demultiplexing
• CPC Class Codes: G02B 6/1225 comprising photonic band-gap structures or photonic lattices
• CPC Class Codes: G02B 6/305 and having an integrated mode-size expanding section, e.g. tapered waveguide

Abstract

Periodic high-index-contrast photonic crystal (PhC) structures such as two-dimensional arrays of air holes in dielectric slabs inhibit light propagation in bands of frequencies and confine light in dislocations where the lattice periodicity is broken. The present invention is a conceptually different approach to photon localization in PhC structures. The disclosed design concept introduces structural perturbations uniformly throughout the fabricated crystal by deliberately changing the shape or orientations of elements that form the lattice. Optimized introduction of such random structural perturbations produces optical nanocavities with ultra-small modal volumes and high quality (Q) factors of over 250,000. Applications of such disordered photonic crystal structures are disclosed for optical sensing systems and random nano-lasers.

Claims

1. An optical device comprising:

a slab, said slab comprising a material; and

a plurality of elements arranged in a lattice, said lattice elements being formed in said slab by removing material, with each said lattice element having a center located at a position (x,y), wherein first and second lattice elements differ in shape or orientation depending on their position (x,y) in the lattice, and said lattice is disordered due to randomized orientation of said lattice elements or geometrical perturbations introduced into said lattice elements.

2. An optical device according to claim 1, wherein area of said lattice elements, spacing of said lattice elements, symmetry of said lattice and arrangement of said lattice elements is chosen so that the device exhibits photonic band gap.

3. An optical device according to claim 1, wherein said slab material comprises one or more of the following:

silicon, silicon nitride, Gallium-Arsenide, a metal, a semiconductor, a polymer, a composite material, quantum dots, quantum wells.

4. An optical device according to claim 1, wherein said lattice elements have been removed at lattice positions (x,y) so that a row of missing elements is formed along a certain crystallographic direction of the lattice.

5. An optical device according to claim 1, wherein said different shapes of lattice elements comprise a circular shape where the radius r is parameterized as r(alpha,x,y), where alpha is an angle and (x,y) the position of the element in the lattice and r(alpha,x,y) is not a constant.

6. An optical device according to claim 1, wherein said lattice elements comprise polygons and wherein orientations of said polygons is varied by rotating a given polygon by an angle alpha(x,y) that varies with lattice position (x,y).

7. An optical device according to claim 1, wherein said lattice elements comprise ellipses and wherein orientations of said ellipses is varied by rotating the major axis of a given ellipse by an angle alpha(x,y) that varies with lattice position (x,y).

8. An optical device according to claim 1, wherein a number of said lattice elements is removed to define a defect cavity, an add-drop filter, a Mach-Zehnder interferometer, or a waveguide.

9. An optical device according to claim 1, wherein parts of the device surface are further modified by adding one of the following:

photochromic molecules, protein, DNA, fluorophore, colloidal quantum dots, hydrogel, dextran, biotinylated polymers, antibodies, chelating ligands, biospecific recognition elements.

10. An optical device according to claim 1, wherein said slab material further contains optical gain material such as quantum dots, quantum wells, one or more layers of quantum dots grown by molecular beam epitaxy, one or more layers of quantum wells grown by molecular beam epitaxy.

11. An optical device according to claim 1, wherein a tapered optical fiber tip is used to evanescently couple light to one or more lattice positions (x,y) where said lattice elements have been removed.

12. An optical device according to claim 1, wherein said difference in shape of said first and second lattice elements is defined by a disorder function of permittivity Δ

∈

(x,y) so that Δ

∈

(x,y)=∈

_real(x,y) ∈

_ideal(x,y), where ∈

_ideal(x,y) represents the permittivity of an ideal lattice with perfect translational symmetry, Δ

∈

(r) represents disorder superimposed as a variation of permittivity in the lattice, (x,y) correspond to a any position (point) in the lattice, ∈

_real(x,y) corresponds to the permittivity values at points (x,y).

17. An optical device according to claim 1 that is exposed to a sample comprising one of the following:

a solution, a gas, an aerosol, protein, DNA, viral particles, cells, body fluids.

18. A method for use of an optical device according to claim 1 as barcode label comprising steps of:

measuring a scattering or transmission spectrum using a laser;

recording said transmission spectra on a computer;

matching the spectrum to a database using computer algorithms.

13. A method for measurements of spectral features comprising the steps of:

excitation of an optical device using a tunable laser, said optical device comprising a slab, said slab comprising a material and a plurality of elements arranged in a lattice, said lattice elements being formed in said slab by removing material, with each said lattice element having a center located at a position (x,y), wherein first and second lattice elements differ in shape or orientation depending on their position (x,y) in the lattice, and said lattice is disordered due to randomized orientation of said lattice elements or geometrical perturbations introduced into said lattice elements;

detection of transmission or scattering or backscattering spectra using a photodetector; and

analysis of a recorded spectrum using a computer;

14. A method for tracking changes in spectral features of a optical device, said optical device comprising a slab, said slab comprising a material and a plurality of elements arranged in a lattice, said lattice elements being formed in said slab by removing material, with each said lattice element having a center located at a position (x,y), wherein first and second lattice elements differ in shape or orientation depending on their position (x,y) in the lattice, and said lattice is disordered due to randomized orientation of said lattice elements or geometrical perturbations introduced into said lattice elements, comprising the steps of:

identifying a wavelength associated with a minima or maxima in a recorded spectral feature using computer algorithms;

recording the wavelengths of said minima or maxima over time; and

plotting a time trace of said recorded wavelengths for further analysis with a computer.

15. A method for tracking changes in spectral features of a device, said device comprising a slab, said slab comprising a material and a plurality of elements arranged in a lattice, said lattice elements being formed in said slab by removing material, with each said lattice element having a center located at a position (x,y), wherein first and second lattice elements differ in shape or orientation depending on their position (x,y) in the lattice, and said lattice is disordered due to randomized orientation of said lattice elements or geometrical perturbations introduced into said lattice elements, comprising the steps of:

recording spectral features before exposure to a sample (baseline);

exposing said device to said sample;

recording spectral features during and after sample exposure; and

analyzing changes in spectral features using computer algorithms.

16. A method for tracking changes in spectral features of a device according to claim 15, wherein said step of exposing said device to a sample comprises the steps of:

sample delivery by microfluidic flow, electrophoretic flow, aerosol flow or by electrowetting;

exposure of said device to said sample for a certain time period; and

optional removing of said sample by exposing said optical device to a second microfluidic or electrophoretic flow.