X-Ray Security Inspection Machine

• US 20100254511A1
• Filed: 03/02/2010
• Published: 10/07/2010
• Est. Priority Date: 02/27/2006
• Status: Active Grant

• Current Assignee: Rapiscan Systems (Cyprus) Ltd. (OSI Systems Incorporated)
• Original Assignee: Rapiscan Systems (Cyprus) Ltd. (OSI Systems Incorporated)
• Inventors: Panesar, Baljinder Singh, Gillard-Hickman, Douglas R.
• Granted Patent: US 8,213,570 B2
• Time in Patent Office: Days
• US Class Current: 378/57
• CPC Class Codes: G01N 23/04 and forming images of the material

Abstract

X-ray security inspection machine (10) comprising an X-ray tunnel (40); a conveyor means (50) for conveying an article through the tunnel; an X-ray source for irradiating the article; and an X-ray detection means for detecting X-rays transmitted through the article. In one aspect, the detection means comprises a photodetector array module (20) actuatable between a first stowed configuration and a second deployed configuration. In a second aspect, the detection means comprises a first unit having a first photodetector array (22); and a second unit, having a second photodetector array (24), offset with respect to the first unit. The units are moveable relative to one another between a first arrangement where the arrays overlap to a first degree and a second arrangement where they overlap to a second, lower degree; preferably zero. Also, a conveyor belt-tracking device (100) comprising a guide frame (104) to receive the conveyor belt (116) and substantially to restrict its motion to a predetermined direction.

Claims

1-32. -32. (canceled)

33. An X-ray security inspection machine, comprising:

a machine housing defining an X-ray tunnel for receiving an article to be inspected;

a conveyor for conveying the article through the tunnel;

an X-ray source for irradiating the article within the tunnel;

A photodetector array module for detecting X-rays transmitted through the article, wherein said photodetector array module is has a first stowed configuration in which the photodetector array module occupies a region of the X-ray tunnel and a second deployed configuration in which the photodetector array module projects from the machine housing and leaves the X-ray tunnel substantially unobstructed; and

an actuator moving the photodetector array module between the stowed and deployed configurations.

34. The X-ray inspection machine of claim 33, wherein the actuator comprises an extendable and retractable actuator arm coupled to the photodetector array module.

35. The X-ray inspection machine of claim 33, wherein the actuator arm is coupled to the photodetector array module via a pivoting arm coupled to the photodetector array module, such that rotational movement of the pivoting arm effected by the actuator arm is transformed into translational movement of the photodetector array module.

36. The X-ray security inspection machine of claim 33, wherein the photodetector array module in its stowed configuration is substantially flush with the housing.

37. The X-ray security inspection machine of claim 33, further comprising a guide for constraining the photodetector array module to linear motion.

38. The X-ray security inspection machine of claim 33, wherein the photodetector array module comprises a first photodetector array arranged to provide a first substantially planar X-ray detection area and wherein the photodetector array module comprises a second photodetector array arranged to provide a second substantially planar X-ray detection area perpendicular to the first photodetector array.

42. The X-ray security inspection machine of claim 38, wherein the first X-ray detection area provided by the photodetector array module is smaller than an overall X-ray detection area provided by the X-ray detector.

43. The X-ray security inspection machine of claim 33 further comprising a stationary photodetector array fixed to the X-ray tunnel, wherein, when in the deployed configuration, the first photodetector array module and the stationary photodetector array provide a substantially continuous X-ray detection area.

44. The X-ray security inspection machine of claim 43, wherein the stationary photodetector array is positioned with respect to the first photodetector array, such that, in the stowed configuration, the first photodetector array and stationary photodetector arrays overlap.

45. The X-ray security inspection machine of claim 33, wherein the photodetector array module is translated by approximately 80 mm between the first stowed configuration and the second deployed configuration.

46. The X-ray security inspection machine of claim 33, further comprising a stowable control console, wherein the control console is deployed automatically with the photodetector array module, upon activation of the machine.

47. An X-ray security inspection machine, comprising:

a machine housing defining an X-ray tunnel for receiving an article to be inspected;

a conveyor for conveying the article through the tunnel;

an X-ray source for irradiating the article within the tunnel;

a first photodetector array;

a second photodetector array, wherein the first photodetector array and the second photodetector array are moveable relative each other, wherein said first photodetector array and the second photodetector array move to form a first arrangement in which the first photodetector array and the second photodetector array overlap to a first degree, wherein said first photodetector array and the second photodetector array move to form a second arrangement in which the first photodetector array and the second photodetector array overlap to a second degree, and wherein said first degree is greater than said second degree.

48. The X-ray security inspection machine of claim 47 wherein said first photodetector array and second photodetector array form an X-ray detection area and wherein said X-ray detection area is variable.

49. The X-ray security inspection machine of claim 48 wherein, when said second degree is zero, said X-ray detection area is at a maximum size.

50. The X-ray security inspection machine of claim 48 wherein, when said first photodetector array and the second photodetector array move to form the first arrangement module, the X-ray detection area is less than when said first photodetector array and the second photodetector array move to form the second arrangement.