×

ANALYTE TEST STRIP WITH COMBINATION ELECTRODE CONTACT AND METER IDENTIFICATION FEATURE

  • US 20100326824A1
  • Filed: 06/24/2009
  • Published: 12/30/2010
  • Est. Priority Date: 06/24/2009
  • Status: Abandoned Application
First Claim
Patent Images

1. An analyte test strip for use with a test meter, the analyte test strip comprising:

  • a first insulating layer;

    a first electrically conductive layer disposed on the first insulating layer, the first electrically conductive layer including;

    at least one electrode portion; and

    at least one electrical contact pad configured for an electrical connector pin of a test meter to travel therealong during insertion of the analyte test strip into the test meter, the electrical contact pad in electrical communication with the electrode portion;

    at least one meter identification feature disposed on the electrical contact pad such that the electrical connector pin of the test meter travels across the meter identification feature during insertion of the analyte test strip into the test meter;

    a second insulating layer disposed above the first insulating layer;

    a patterned spacer layer positioned between the first insulating layer and the first electrically conductive layer, the patterned spacer layer defining a sample-receiving chamber therein;

    wherein the electrical contact pad has a predetermined contact electrical characteristic value and the meter identification feature has a predetermined identification feature electrical characteristic value that is dissimilar from the predetermined contact electrical characteristic.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×