• US 20110061462A1
  • Filed: 05/13/2009
  • Published: 03/17/2011
  • Est. Priority Date: 05/14/2008
  • Status: Active Grant
First Claim
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1. A measurement method that uses a crystal oscillator,wherein the method comprises:

  • contacting a material to be measured to the crystal oscillator and oscillating the crystal oscillator that includes electrodes formed on both surfaces of a piezoelectric plate, and an uneven-surface formed either on one of the electrodes disposed on the side in contact with the material to be measured, or on a detector formed on the electrode; and

    measuring an amount of change in frequency (f2) that corresponds to the high-frequency side of two frequencies that represent a half value of a conductance maximum value of the crystal oscillator, so as to measure a density of the material.

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