SINGLE LAYER CAPACITIVE IMAGE SENSING
First Claim
1. A capacitive imaging sensor device, said device comprising:
- a sensor substrate;
a first set of sensor electrodes disposed on a first surface of said sensor substrate, wherein sensor electrodes of said first set of sensor electrodes are disposed substantially in parallel with a first axis, and wherein at least two sensor electrodes of said first set of sensor electrodes extend for different lengths along said first axis;
a second set of sensor electrodes disposed on said first surface, wherein sensor electrodes of said second set of sensor electrodes are disposed substantially in parallel with said first axis, and wherein sensor electrodes of said first set and second set are disposed in a common single layer; and
a processing system coupled with said first set and said second set of sensor electrodes, said processing system configured for;
measuring a first capacitive coupling between a first sensor electrode of said first set of sensor electrodes and a sensor electrode of said second set of sensor electrodes;
measuring a second capacitive coupling between a second sensor electrode of said first set of sensor electrodes and said sensor electrode of said second set of sensor electrodes; and
determining a capacitance image using said first and second measurements of capacitive coupling.
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Accused Products
Abstract
A capacitive imaging sensor device includes a sensor substrate. A first set of sensor electrodes is disposed on a first surface of the sensor substrate, substantially in parallel with a first axis, and with at least two of its sensor electrodes extending for different lengths along the first axis. A second set of sensor electrodes is disposed on the first surface, substantially in parallel with the first axis, and in a common single layer with the first set. A processing system is coupled with the first and second sets and configured for: measuring a first capacitive coupling between a first sensor electrode of the first set and a sensor electrode of the second set; measuring a second capacitive coupling between a second sensor electrode of the first set and the sensor electrode of the second set; and determining a capacitance image using the first and second measurements of capacitive coupling.
125 Citations
20 Claims
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1. A capacitive imaging sensor device, said device comprising:
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a sensor substrate; a first set of sensor electrodes disposed on a first surface of said sensor substrate, wherein sensor electrodes of said first set of sensor electrodes are disposed substantially in parallel with a first axis, and wherein at least two sensor electrodes of said first set of sensor electrodes extend for different lengths along said first axis; a second set of sensor electrodes disposed on said first surface, wherein sensor electrodes of said second set of sensor electrodes are disposed substantially in parallel with said first axis, and wherein sensor electrodes of said first set and second set are disposed in a common single layer; and a processing system coupled with said first set and said second set of sensor electrodes, said processing system configured for; measuring a first capacitive coupling between a first sensor electrode of said first set of sensor electrodes and a sensor electrode of said second set of sensor electrodes; measuring a second capacitive coupling between a second sensor electrode of said first set of sensor electrodes and said sensor electrode of said second set of sensor electrodes; and determining a capacitance image using said first and second measurements of capacitive coupling. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A capacitive imaging sensor, said sensor comprising:
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a sensor substrate; a first set of sensor electrodes disposed on a first surface of said sensor substrate, wherein sensor electrodes of said first set of sensor electrodes are disposed substantially in parallel with a first axis, and wherein at least two sensor electrodes of said first set of sensor electrodes extend for different lengths along said first axis; and a second set of sensor electrodes disposed on said first surface, wherein sensor electrodes of said second set of sensor electrodes are disposed substantially in parallel with said first axis, and wherein sensor electrodes of said first set and second set are disposed in a common single layer such that a capacitance image relative to said sensor is determinable using measurements of capacitive coupling between sensor electrodes of said common single layer. - View Dependent Claims (12, 13, 14, 15, 16)
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17. A method of capacitive sensing, said method comprising:
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acquiring a first measurement of capacitive coupling between a first sensor electrode of a first set of sensor electrodes and a sensor electrode of a second set of sensor electrodes; acquiring a second measurement of capacitive coupling between a second sensor electrode of said first set of sensor electrodes and said sensor electrode of said second set of sensor electrodes; and determining a capacitance image using said first and second measurements of capacitive coupling, wherein sensor electrodes of said first set are disposed substantially in parallel with a first axis and second set are disposed substantially in parallel with said first axis, wherein sensor electrodes of said first set and second set are disposed in a common single layer on a first surface of a sensor substrate, and wherein at least two sensor electrodes of said first set extend for different lengths along said first axis. - View Dependent Claims (18, 19, 20)
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Specification