APPARATUSES, DEVICE, AND METHODS FOR CLEANING TESTER INTERFACE CONTACT ELEMENTS AND SUPPORT HARDWARE

  • US 20120042463A1
  • Filed: 11/04/2011
  • Published: 02/23/2012
  • Est. Priority Date: 12/03/2009
  • Status: Active Grant
First Claim
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1. A cleaning device for cleaning the pin contact elements and support hardware in a semiconductor testing apparatus, the cleaning device comprising:

  • a cleaning layer with a predetermined configuration appropriate for the particular pin contact elements;

    a substrate having a configuration to be introduced into the testing apparatus during the normal testing operating of the testing apparatus, wherein the substrate comprises a surrogate semiconductor wafer or packaged IC device;

    the cleaning layer, secured to the substrate, having predetermined characteristics that cause the pad to clean debris the pin contact elements and support hardware when the pin contact elements and support hardware contact the pad so that the pin contact elements and support hardware are cleaned, without modification to normal operation of the testing machine.

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