System, method, and product for imaging probe arrays with small feature sizes
First Claim
Patent Images
1. A method for resolving features on a probe array, comprising:
- acquiring a plurality of micro-shifted images of a region of a probe array using an image acquisition device comprising an objective lens and a sensing element having pixels;
shifting the images by less than one half a size of the pixel of a sensing element while maintaining a fixed spatial relationship between the probe array and an objective lens of the image acquisition device;
reconstructing an image of the probe array using the micro-shifted images; and
deriving intensity values for one or more probe features disposed on the probe array from the reconstructed image.
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Abstract
An embodiment of a method for resolving features on a probe array is described that, comprises acquiring a plurality of micro-shifted images of a region of a probe array; reconstructing an image of the probe array using the micro-shifted images; and deriving intensity values for one or more probe features disposed on the probe array from the reconstructed image.
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Citations
9 Claims
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1. A method for resolving features on a probe array, comprising:
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acquiring a plurality of micro-shifted images of a region of a probe array using an image acquisition device comprising an objective lens and a sensing element having pixels; shifting the images by less than one half a size of the pixel of a sensing element while maintaining a fixed spatial relationship between the probe array and an objective lens of the image acquisition device; reconstructing an image of the probe array using the micro-shifted images; and deriving intensity values for one or more probe features disposed on the probe array from the reconstructed image. - View Dependent Claims (2, 3, 4)
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5. A method for obtaining subpixel resolution, comprising:
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creating a set of uniformly micro-shifted images using an image acquisition device comprising an objective lens and a sensing element having pixels; shifting the images by less than one half the size of the pixel of a sensing element while maintaining a fixed spatial relationship between the probe array and an objective lens of the image acquisition device; applying a set of linear equations to the images, the equations describing the relationship between subpixel intensities and the pixel intensities in the micro-shifted images caused by the subpixel intensities; and applying techniques of linear algebra to solve for those subpixel intensities. - View Dependent Claims (6, 8)
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9-16. -16. (canceled)
Specification