Apparatus and method for generating depth image

• US 20120162370A1
• Filed: 05/27/2011
• Published: 06/28/2012
• Est. Priority Date: 12/27/2010
• Status: Active Grant

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Samsung Electronics Co. Ltd.
• Inventors: Kim, Sung Cheol, Lim, Hwa Sup, Ramez, Kassou Ahmad
• Granted Patent: US 9,258,548 B2
• Time in Patent Office: Days
• US Class Current: 348/46
• CPC Class Codes: G01B 11/02 for measuring length, width or thickness G01B11/08 takes precedence
• CPC Class Codes: G01B 11/24 for measuring contours or curvatures
• CPC Class Codes: G01S 17/08 for measuring distance only indirect measurement G01S17/46; active triangulation systems G01S17/48
• CPC Class Codes: G01S 17/89 for mapping or imaging
• CPC Class Codes: H04N 13/254 in combination with electromagnetic radiation sources for illuminating objects

Abstract

Provided is a depth image generating apparatus. The depth image generating apparatus may include a filtering unit, a modulation unit, and a sensing unit. The filtering unit may band pass filter an infrared light of a first wavelength band among infrared lights received from an object. The modulation unit may modulate the infrared light of the first wavelength band to an infrared light of a second wavelength band. The sensing unit may generate an electrical signal by sensing the modulated infrared light of the second wavelength band.

Claims

1. An apparatus for generating a depth image, comprising:

a filtering unit to band pass filter an infrared light of a first wavelength band among infrared lights received from an object;

a modulation unit to modulate the infrared light of the first wavelength band to an infrared light of a second wavelength band; and

a sensing unit to generate an electrical signal by sensing the modulated infrared light of the second wavelength band.

2. The apparatus of claim 1, further comprising:

a light emitting unit to emit the infrared light of the first wavelength band towards the object.

3. The apparatus of claim 1, further comprising:

a processing unit to generate a depth image corresponding to the object using the electrical signal.

4. The apparatus of claim 1, wherein the first wavelength band corresponds to a wavelength band having an infrared intensity less than or equal to a first threshold on the surface of the earth in a sunlight environment.

5. The apparatus of claim 1, wherein the first wavelength band corresponds to a wavelength band comprising 1300 nm and having a bandwidth less than or equal to a second threshold.

6. The apparatus of claim 1, wherein:

the sensing unit corresponds to a silicon based infrared sensor, and

the second wavelength band corresponds to a wavelength band in which an efficiency of the sensing unit is greater than or equal to a third threshold.

7. The apparatus of claim 1, wherein, in the second wavelength band, an efficiency of the sensing unit is greater than or equal to a third threshold.

8. The apparatus of claim 1, wherein the second wavelength band corresponds to a wavelength band comprising 800 nm and having a bandwidth less than or equal to a fourth threshold.

9. A method of generating a depth image, comprising:

band pass filtering, by a filtering unit of a depth image generating apparatus, an infrared light of a first wavelength band among infrared lights received from an object;

modulating, by a modulation unit of the depth image generating apparatus, the infrared light of the first wavelength band to an infrared light of a second wavelength band; and

generating, by a sensing unit of the depth image generating apparatus, an electrical signal by sensing the modulated infrared light of the second wavelength band.

10. The method of claim 9, prior to the band pass filtering, further comprising:

emitting, by a light emitting unit of the depth image generating apparatus, the infrared light of the first wavelength band towards the object; and

receiving, by a light receiving unit of the depth image generating apparatus, at least a portion of the infrared light of the first wavelength band reflected from the object.

11. The method of claim 9, further comprising:

generating, by a processing unit of the depth image generating apparatus, a depth image corresponding to the object using the electrical signal.

12. The method of claim 9, wherein the first wavelength band corresponds to a wavelength band having an infrared intensity less than or equal to a first threshold on the surface of the earth in a sunlight environment.

13. The method of claim 9, wherein the first wavelength band corresponds to a wavelength band comprising 1300 nm and having a bandwidth less than or equal to a second threshold.

14. The method of claim 9, wherein:

the sensing unit corresponds to a silicon based infrared sensor, and

the second wavelength band corresponds to a wavelength band in which an efficiency of the sensing unit is greater than or equal to a third threshold.

15. The method of claim 9, wherein the second wavelength band corresponds to a wavelength band comprising 800 nm and having a bandwidth less than or equal to a fourth threshold.

16. At least one non-transitory computer-readable medium storing computer readable instructions to control at least one processor to implement the method of claim 9.

17. A method of generating a depth image of an object, comprising:

band pass filtering an infrared light of a first wavelength band among infrared lights received from an object;

modulating the filtered infrared light of the first wavelength band to an infrared light of a second wavelength band;

generating an electrical signal by sensing the modulated infrared light of the second wavelength band; and

generating, using at least one processor, a depth image corresponding to the object using the electrical signal.

18. At least one non-transitory computer-readable medium storing computer readable instructions to control at least one processor to implement the method of claim 17.