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SYSTEM AND METHOD FOR PROVIDING ADAPTIVE MANUFACTURING DIAGNOSES IN A CIRCUIT BOARD ENVIRONMENT

  • US 20120233104A1
  • Filed: 03/07/2011
  • Published: 09/13/2012
  • Est. Priority Date: 03/07/2011
  • Status: Active Grant
First Claim
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1. A method, comprising:

  • collecting inputs for a circuit board under test;

    evaluating historical repair records using a neuron network;

    providing repair actions for the circuit board based on the historical repair records; and

    providing an output reflecting a particular component of the circuit board to be replaced or to be repaired, wherein the output is associated with a developed probability of successfully fixing an issue that was identified by the test.

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