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APPARATUS AND METHOD FOR MEASURING ELECTRICAL PARAMETERS OF CIRCUIT

  • US 20120262153A1
  • Filed: 03/16/2012
  • Published: 10/18/2012
  • Est. Priority Date: 03/17/2011
  • Status: Active Grant
First Claim
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1. An apparatus for measuring an electrical parameter of a circuit, the apparatus comprising:

  • a measuring unit measuring the electrical parameter;

    a plurality of first connection terminals; and

    a first selection switch selectively causing a first conduction between the first selection switch and at least one of the plurality of first connection terminals.

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